Field Emission Scanning Electron Microscopy

1. Introduction
Nicolas Brodusch, Hendrix Demers, Raynald Gauvin

2. Developments in Field Emission Gun Technologies and Advanced Detection Systems
Nicolas Brodusch, Hendrix Demers, Raynald Gauvin

3. Electron Detection Strategies for High Resolution Imaging: Deceleration and Energy Filtration
Nicolas Brodusch, Hendrix Demers, Raynald Gauvin

4. Low Voltage SEM
Nicolas Brodusch, Hendrix Demers, Raynald Gauvin

5. Low Voltage STEM in the SEM
Nicolas Brodusch, Hendrix Demers, Raynald Gauvin

6. The f-Ratio Method for X-Ray Microanalysis in the SEM
Nicolas Brodusch, Hendrix Demers, Raynald Gauvin

7. X-Ray Imaging with a Silicon Drift Detector Energy Dispersive Spectrometer
Nicolas Brodusch, Hendrix Demers, Raynald Gauvin

8. Electron Diffraction Techniques in the SEM
Nicolas Brodusch, Hendrix Demers, Raynald Gauvin

9. Magnetic Domain Imaging
Nicolas Brodusch, Hendrix Demers, Raynald Gauvin

10. Advanced Specimen Preparation
Nicolas Brodusch, Hendrix Demers, Raynald Gauvin

11. Conclusion and Perspectives
Nicolas Brodusch, Hendrix Demers, Raynald Gauvin

Nyckelord: Materials Science, Characterization and Evaluation of Materials, Spectroscopy and Microscopy, Nanotechnology and Microengineering