Polar Oxides: Properties, Characterization, and Imaging

Here, more than 20 experts from leading research institutes around the world present the entire scope of this rapidly developing field. In so doing, they cover a wide range of topics, including the characterization and investigation of structural, dielectric and piezoelectric properties of ceramic materials, a well as phase transitions, electrical and optical properties and microscopic investigations. Another feature is a complete profile of the properties of polar oxides—from their proof to their latest applications.

Throughout, the authors review, discuss and assess the material properties with regard to new and advanced characterization and imaging techniques.

For physicists, physicochemists, semiconductor and solid state physicists, materials scientists, and students of chemistry and physics.

Nyckelord: TECHNOLOGY & ENGINEERING / Electronics / Semiconductors TEC008090