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Padilla, Moises

Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications

Padilla, Moises - Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications, e-bok

124,30€

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ISBN: 9783527681105
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The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.

Nyckelord: interferometry; practical; opticalmetrology; classical; book; theoretical principles; applications; novelty; major; frequency; work; function; transfer; stochastic; theory; use; ftf; phase; response; spectral; demodulation algorithms, Sensors, Instrumentation & Measurement, Spectroscopy, Sensors, Instrumentation & Measurement, Spectroscopy

Författare
 
 
Utgivare
John Wiley and Sons, Inc.
Utgivningsår
2014
Språk
en
Utgåva
1
Sidantal
344 sidor
Kategori
Naturvetenskaper
Format
E-bok
eISBN (ePUB)
9783527681105
Tryckt ISBN
9783527411528

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