Industrial X-Ray Computed Tomography

1. Introduction to Industrial X-ray Computed Tomography
Adam Thompson, Richard Leach

2. Principles of X-ray Computed Tomography
Petr Hermanek, Jitendra Singh Rathore, Valentina Aloisi, Simone Carmignato

3. X-ray Computed Tomography Devices and Their Components
Evelina Ametova, Gabriel Probst, Wim Dewulf

4. Processing, Analysis and Visualization of CT Data
Christoph Heinzl, Alexander Amirkhanov, Johann Kastner

5. Error Sources
Alessandro Stolfi, Leonardo Chiffre, Stefan Kasperl

6. Qualification and Testing of CT Systems
Markus Bartscher, Ulrich Neuschaefer-Rube, Jens Illemann, Fabrício Borges de Oliveira, Alessandro Stolfi, Simone Carmignato

7. Towards Traceability of CT Dimensional Measurements
Massimiliano Ferrucci

8. Applications of CT for Non-destructive Testing and Materials Characterization
Martine Wevers, Bart Nicolaï, Pieter Verboven, Rudy Swennen, Staf Roels, Els Verstrynge, Stepan Lomov, Greet Kerckhofs, Bart Meerbeek, Athina M. Mavridou, Lars Bergmans, Paul Lambrechts, Jeroen Soete, Steven Claes, Hannes Claes

9. Applications of CT for Dimensional Metrology
Andrea Buratti, Judith Bredemann, Michele Pavan, Robert Schmitt, Simone Carmignato

Nyckelord: Materials Science, Characterization and Evaluation of Materials, Manufacturing, Machines, Tools, Optical and Electronic Materials, Atomic, Molecular, Optical and Plasma Physics