Multiple Instance Learning

1. Introduction
Francisco Herrera, Sebastián Ventura, Rafael Bello, Chris Cornelis, Amelia Zafra, Dánel Sánchez-Tarragó, Sarah Vluymans

2. Multiple Instance Learning
Francisco Herrera, Sebastián Ventura, Rafael Bello, Chris Cornelis, Amelia Zafra, Dánel Sánchez-Tarragó, Sarah Vluymans

3. Multi-instance Classification
Francisco Herrera, Sebastián Ventura, Rafael Bello, Chris Cornelis, Amelia Zafra, Dánel Sánchez-Tarragó, Sarah Vluymans

4. Instance-Based Classification Methods
Francisco Herrera, Sebastián Ventura, Rafael Bello, Chris Cornelis, Amelia Zafra, Dánel Sánchez-Tarragó, Sarah Vluymans

5. Bag-Based Classification Methods
Francisco Herrera, Sebastián Ventura, Rafael Bello, Chris Cornelis, Amelia Zafra, Dánel Sánchez-Tarragó, Sarah Vluymans

6. Multi-instance Regression
Francisco Herrera, Sebastián Ventura, Rafael Bello, Chris Cornelis, Amelia Zafra, Dánel Sánchez-Tarragó, Sarah Vluymans

7. Unsupervised Multiple Instance Learning
Francisco Herrera, Sebastián Ventura, Rafael Bello, Chris Cornelis, Amelia Zafra, Dánel Sánchez-Tarragó, Sarah Vluymans

8. Data Reduction
Francisco Herrera, Sebastián Ventura, Rafael Bello, Chris Cornelis, Amelia Zafra, Dánel Sánchez-Tarragó, Sarah Vluymans

9. Imbalanced Multi-instance Data
Francisco Herrera, Sebastián Ventura, Rafael Bello, Chris Cornelis, Amelia Zafra, Dánel Sánchez-Tarragó, Sarah Vluymans

10. Multiple Instance Multiple Label Learning
Francisco Herrera, Sebastián Ventura, Rafael Bello, Chris Cornelis, Amelia Zafra, Dánel Sánchez-Tarragó, Sarah Vluymans

Nyckelord: Computer Science, Artificial Intelligence (incl. Robotics), Image Processing and Computer Vision, Algorithm Analysis and Problem Complexity