Borja, Juan Pablo
Dielectric Breakdown in Gigascale Electronics
1. Introduction
Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky
2. General Theories
Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky
3. Measurement Tools and Test Structures
Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky
4. Experimental Techniques
Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky
5. Breakdown Experiments
Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky
6. Kinetics of Charge Carrier Confinement in Thin Dielectrics
Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky
7. Theory of Dielectric Breakdown in Nano-Porous Thin Films
Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky
8. Dielectric Breakdown in Copper Interconnects
Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky
9. Reconsidering Conventional Field Acceleration Models
Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky
Nyckelord: Materials Science, Optical and Electronic Materials, Nanotechnology and Microengineering, Electronic Circuits and Devices, Nanotechnology
- Författare
- Borja, Juan Pablo
- Lu, Toh-Ming
- Plawsky, Joel
- Utgivare
- Springer
- Utgivningsår
- 2016
- Språk
- en
- Utgåva
- 1
- Serie
- SpringerBriefs in Materials
- Sidantal
- 8 sidor
- Kategori
- Teknologi, energi, trafik
- Format
- E-bok
- eISBN (PDF)
- 9783319432205
- Tryckt ISBN
- 978-3-319-43218-2