Ueda, Osamu
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
1. Reliability Testing of Semiconductor Optical Devices
Mitsuo Fukuda
2. Failure Analysis of Semiconductor Optical Devices
Osamu Ueda, Robert W. Herrick
3. Failure Analysis Using Optical Evaluation Technique (OBIC) of LDs and APDs for Fiber Optical Communication
Tatsuya Takeshita
4. Reliability and Degradation of III-V Optical Devices Focusing on Gradual Degradation
Osamu Ueda
5. Catastrophic Optical Damage in High-Power, Broad-Area Laser Diodes
Aland K. Chin, Rick K. Bertaska
6. Reliability and Degradation of Vertical-Cavity Surface-Emitting Lasers
Robert W. Herrick
7. Structural Defects in GaN-Based Materials and Their Relation to GaN-Based Laser Diodes
Shigetaka Tomiya
8. InGaN Laser Diode Degradation
Piotr Perlin, Łucja Marona
9. Radiation-Enhanced Dislocation Glide: The Current Status of Research
Koji Maeda
10. Mechanism of Defect Reactions in Semiconductors
Yuzo Shinozuka
11. Reliability Studies in the Real World
William J. Roesch
12. Strain Effects in AlGaN/GaN HEMTs
Min Chu, Andrew D. Koehler, Amit Gupta, Srivatsan Parthasarathy, Mehmet Onur Baykan, Scott E. Thompson, Toshikazu Nishida
13. Reliability Issues in AlGaN/GaN High Electron Mobility Transistors
E. A. Douglas, L. Liu, C. F. Lo, B. P. Gila, F. Ren, Stephen J. Pearton
14. GaAs Device Reliability: High Electron Mobility Transistors and Heterojunction Bipolar Transistors
F. Ren, E. A. Douglas, Stephen J. Pearton
15. Novel Dielectrics for GaN Device Passivation and Improved Reliability
F. Ren, Stephen J. Pearton, B. P. Gila, C. R. Abernathy, R. C. Fitch
16. Reliability Simulation
M. E. Law, M. Griglione, E. Patrick, N. Rowsey, D. Horton
17. The Analysis of Wide Band Gap Semiconductors Using Raman Spectroscopy
Sukwon Choi, Eric Heller, Don Dorsey, Samuel Graham
18. Reliability Study of InP-Based HBTs Operating at High Current Density
Yoshino K. Fukai, Kenji Kurishima
Nyckelord: Physics, Optics, Optoelectronics, Plasmonics and Optical Devices, Optical and Electronic Materials, Electronics and Microelectronics, Instrumentation, Electronic Circuits and Devices, Characterization and Evaluation of Materials, Laser Technology, Photonics
- Författare
- Ueda, Osamu
- Pearton, Stephen J.
- Utgivare
- Springer
- Utgivningsår
- 2013
- Språk
- en
- Utgåva
- 2013
- Sidantal
- 15 sidor
- Kategori
- Naturvetenskaper
- Format
- E-bok
- eISBN (PDF)
- 9781461443377