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Egerton, R.F.

Electron Energy-Loss Spectroscopy in the Electron Microscope

Egerton, R.F. - Electron Energy-Loss Spectroscopy in the Electron Microscope, e-bok

236,75€

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ISBN: 9781441995834
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Table of contents

1. An Introduction to EELS
R.F. Egerton

2. Energy-Loss Instrumentation
R.F. Egerton

3. Physics of Electron Scattering
R.F. Egerton

4. Quantitative Analysis of Energy-Loss Data
R.F. Egerton

5. TEM Applications of EELS
R.F. Egerton

6. Bethe Theory for High Incident Energies and Anisotropic Materials
R.F. Egerton

7. Computer Programs
R.F. Egerton

8. Plasmon Energies and Inelastic Mean Free Paths
R.F. Egerton

9. Inner-Shell Energies and Edge Shapes
R.F. Egerton

10. Electron Wavelengths, Relativistic Factors, and Physical Constants
R.F. Egerton

11. Options for Energy-Loss Data Acquisition
R.F. Egerton

Nyckelord: Materials Science, Characterization and Evaluation of Materials, Solid State Physics, Spectroscopy and Microscopy, Spectroscopy/Spectrometry, Nanotechnology

Författare
Utgivare
Springer
Utgivningsår
2011
Språk
en
Utgåva
1
Sidantal
12 sidor
Kategori
Teknologi, energi, trafik
Format
E-bok
eISBN (PDF)
9781441995834

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