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Kanekawa, Nobuyasu

Dependability in Electronic Systems

Kanekawa, Nobuyasu - Dependability in Electronic Systems, e-bok

109,95€

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ISBN: 9781441967152
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Table of contents

1. Introduction
Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu

2. Terrestrial Neutron-Induced Failures in Semiconductor Devices and Relevant Systems and Their Mitigation Techniques
Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu

3. Electromagnetic Compatibility
Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu

4. Power Integrity
Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu

5. Fault-Tolerant System Technology
Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu

6. Challenges in the Future
Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu

Nyckelord: Engineering, Circuits and Systems, Computer-Aided Engineering (CAD, CAE) and Design

Författare
 
 
 
Utgivare
Springer
Utgivningsår
2011
Språk
en
Utgåva
1
Sidantal
25 sidor
Kategori
Teknologi, energi, trafik
Format
E-bok
eISBN (PDF)
9781441967152

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