Kirkland, Earl J.
Advanced Computing in Electron Microscopy
Table of contents
1. Introduction
Earl J. Kirkland
2. The Transmission Electron Microscope
Earl J. Kirkland
3. Linear Image Approximations
Earl J. Kirkland
4. Sampling and the Fast Fourier Transform
Earl J. Kirkland
5. Calculation of Images of Thin Specimens
Earl J. Kirkland
6. Theory of Calculation of Images of Thick Specimens
Earl J. Kirkland
7. Multislice Applications and Examples
Earl J. Kirkland
8. The Programs
Earl J. Kirkland
9. Plotting Transfer Functions
Earl J. Kirkland
10. The Fourier Projection Theorem
Earl J. Kirkland
11. Atomic Potentials and Scattering Factors
Earl J. Kirkland
12. Bilinear Interpolation
Earl J. Kirkland
13. 3D Perspective View
Earl J. Kirkland
Nyckelord: Materials Science, Characterization and Evaluation of Materials, Electrical Engineering
- Författare
- Kirkland, Earl J.
- Utgivare
- Springer
- Utgivningsår
- 2010
- Språk
- en
- Utgåva
- 1
- Sidantal
- 10 sidor
- Kategori
- Teknologi, energi, trafik
- Format
- E-bok
- eISBN (PDF)
- 9781441965332
