Advanced Test Methods for SRAMs

1. Basics on SRAM Testing
Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel

2. Resistive-Open Defects in Core-Cells
Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel

3. Resistive-Open Defects in Pre-charge Circuits
Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel

4. Resistive-Open Defects in Address Decoders
Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel

5. Resistive-Open Defects in Write Drivers
Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel

6. Resistive-Open Defects in Sense Amplifiers
Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel

7. Faults Due to Process Variations in SRAMs
Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel

8. Diagnosis and Design-for-Diagnosis
Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel

Nyckelord: Engineering, Circuits and Systems, Computer-Aided Engineering (CAD, CAE) and Design