Girard, Patrick
Power-Aware Testing and Test Strategies for Low Power Devices
1. Fundamentals of VLSI Testing
Laung-Terng Wang, Charles E. Stroud
2. Power Issues During Test
Sandip Kundu, Alodeep Sanyal
3. Low-Power Test Pattern Generation
Xiaoqing Wen, Seongmoon Wang
4. Power-Aware Design-for-Test
Hans-Joachim Wunderlich, Christian G. Zoellin
5. Power-Aware Test Data Compression and BIST
Sandeep Kumar Goel, Krishnendu Chakrabarty
6. Power-Aware System-Level Test Planning
Erik Larsson, C. P. Ravikumar
7. Low-Power Design Techniques and Test Implications
Kaushik Roy, Swarup Bhunia
8. Test Strategies for Multivoltage Designs
Saqib Khursheed, Bashir M. Al-Hashimi
9. Test Strategies for Gated Clock Designs
Brion Keller, Krishna Chakravadhanula
10. Test of Power Management Structures
Mark Kassab, Mohammad Tehranipoor
11. EDA Solution for Power-Aware Design-for-Test
Mokhtar Hirech
Nyckelord: Engineering, Circuits and Systems, Computer-Aided Engineering (CAD, CAE) and Design
- Författare
- Girard, Patrick
- Nicolici, Nicola
- Wen, Xiaoqing
- Utgivare
- Springer
- Utgivningsår
- 2010
- Språk
- en
- Utgåva
- 1
- Sidantal
- 20 sidor
- Kategori
- Teknologi, energi, trafik
- Format
- E-bok
- eISBN (PDF)
- 9781441909282