Petersen, Edward
Single Event Effects in Aerospace
Nyckelord: Cross Sections; Heavy Ions; Rate Predictions; Semiconductor device radiation effects; Single event characterization; Single event charge collection; Single Event Effect (SEE); Single event mechanisms; Single event Modeling; Single event upset; Soft error rate; Soft errors; Space Environment, Semiconductors, Aeronautic & Aerospace Engineering, Semiconductors, Aeronautic & Aerospace Engineering
- Författare
- Petersen, Edward
- Utgivare
- John Wiley and Sons, Inc.
- Utgivningsår
- 2011
- Språk
- en
- Utgåva
- 1
- Sidantal
- 520 sidor
- Kategori
- Teknologi, energi, trafik
- Format
- E-bok
- eISBN (ePUB)
- 9781118084311
- Tryckt ISBN
- 9780470767498