Carro, Luigi
Fault-Tolerance Techniques for SRAM-based FPGAs
Table of contents
1. Introduction
2. Radiation Effects in Integrated Circuits
3. Single Event Upset (SEU) Mitigation Techniques
4. Architectural SEU Mitigation Techniques
5. High-Level SEU Mitigation Techniques
6. Triple Modular Redundancy (TMR) Robustness
7. Designing and Testing a TMR Micro-Controller
8. Reducing TMR Overheads: Part I
9. Reducing TMR Overheads: Part II
10. Final Remarks
DRM-restrictions
Printing: not available
Clipboard copying: not available
Nyckelord: TECHNOLOGY & ENGINEERING / General TEC000000
- Författare
- Carro, Luigi
- Kastensmidt, Fernanda Lima
- Reis, Ricardo
- Utgivare
- Springer
- Utgivningsår
- 2006
- Språk
- en
- Utgåva
- 1
- Kategori
- Teknologi, energi, trafik
- Format
- E-bok
- eISBN (PDF)
- 9780387310695
