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Gizopoulos, Dimitris

Gizopoulos / Advances in ElectronicTesting

Gizopoulos, Dimitris - Gizopoulos / Advances in ElectronicTesting, e-bok

104,45€

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ISBN: 9780387294094
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Table of contents

1. Defect-Orinted Testing
Robert. C Aitken

2. Failure Mechanisms and Testing in Nanometer Technologies
Jaume Segura, Charles Hawkins, Jerry Soden

3. Silicon Debug
Doug Josephson, Bob Gottlieb

4. Delay Testing
Adam Cron

5. High-Speed Digital Test Interfaces
Wolfgang Maichen

6. DFT_Oriented,Low-Cost Testers
Al Coruch, Geir Eide

7. Embedded Cores and System-on-Chip Testing
Rubin Parekhji

8. Embedded MemoryTesting
R. Dean Adams

9. Mixed-Signal Testing and DfT
Stephen Sunter

10. RF Testing
Randy Wolf, Mustapha Slamani, John Ferrario, Jayendra Bhagat

11. Loaded Board Testing
Kenneth P. Parker

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Nyckelord: TECHNOLOGY & ENGINEERING / General TEC000000

Författare
Utgivare
Springer
Utgivningsår
2006
Språk
en
Utgåva
1
Kategori
Teknologi, energi, trafik
Format
E-bok
eISBN (PDF)
9780387294094

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