Gizopoulos, Dimitris
Gizopoulos / Advances in ElectronicTesting
1. Defect-Orinted Testing
Robert. C Aitken
2. Failure Mechanisms and Testing in Nanometer Technologies
Jaume Segura, Charles Hawkins, Jerry Soden
3. Silicon Debug
Doug Josephson, Bob Gottlieb
4. Delay Testing
Adam Cron
5. High-Speed Digital Test Interfaces
Wolfgang Maichen
6. DFT_Oriented,Low-Cost Testers
Al Coruch, Geir Eide
7. Embedded Cores and System-on-Chip Testing
Rubin Parekhji
8. Embedded MemoryTesting
R. Dean Adams
9. Mixed-Signal Testing and DfT
Stephen Sunter
10. RF Testing
Randy Wolf, Mustapha Slamani, John Ferrario, Jayendra Bhagat
11. Loaded Board Testing
Kenneth P. Parker
DRM-restrictions
Printing: not available
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Nyckelord: TECHNOLOGY & ENGINEERING / General TEC000000
- Författare
- Gizopoulos, Dimitris
- Utgivare
- Springer
- Utgivningsår
- 2006
- Språk
- en
- Utgåva
- 1
- Kategori
- Teknologi, energi, trafik
- Format
- E-bok
- eISBN (PDF)
- 9780387294094