Japan, The Surface Science Society of
Compendium of Surface and Interface Analysis
1. Acoustic Microscopy
Naohiro Hozumi
2. Action Spectroscopy with STM
Kenta Motobayashi
3. Ambient Pressure X-Ray Photoelectron Spectroscopy
Hiroshi Kondoh
4. Angle-Resolved Ultraviolet Photoelectron Spectroscopy
Takafumi Sato
5. Atom Probe Field Ion Microscope
Masahiko Tomitori
6. Atomic Force Microscope
Shintaro Fujii
7. Auger Electron Spectroscopy
Fumihiko Matsui
8. Cathodoluminescence
Takashi Sekiguchi
9. Conductive Atomic Force Microscopy
Risa Fuji
10. Differential Interference Contrast Microscopy/Phase-Contrast Microscopy
Hiroshi Komatsu, Gen Sazaki
11. Dynamic Secondary Ion Mass Spectrometry
Mitsuhiro Tomita
12. Elastic Recoil Detection Analysis
Daiichiro Sekiba
13. Electrochemical Atomic Force Microscopy
Toru Utsunomiya, Yasuyuki Yokota, Ken-ichi Fukui
14. Electrochemical Infrared Spectroscopy
Shen Ye
15. Electrochemical Scanning Tunneling Microscopy
Tomoaki Nishino
16. Electrochemical Second Harmonic Generation
Ichizo Yagi
17. Electrochemical Sum Frequency Generation
Hidenori Noguchi
18. Electrochemical Surface X-Ray Scattering
Toshihiro Kondo
19. Electrochemical Transmission Electron Microscopy
Yoshifumi Oshima
20. Electrochemical X-Ray Absorption Fine Structure
Takuya Masuda
21. Electrochemical X-Ray Photoelectron Spectroscopy
Takuya Masuda
22. Electron Backscatter Diffraction
Rika Yoda
23. Electron Energy-Loss Spectroscopy
Tadaaki Nagao
24. Electron Probe Microanalysis
Hiroshi Sakamae
25. Electron-Stimulated Desorption
Naoya Miyauchi
26. Electron-Beam-Induced Current
Jun Chen, Takashi Sekiguchi
27. Ellipsometry
Toshihide Tsuru
28. Environmental SEM (Atmospheric SEM)
Yusuke Ominami
29. Environmental Transmission Electron Microscopy
Tadahiro Kawasaki
30. Extended X-Ray Absorption Fine Structure
Hitoshi Abe
31. Focused Ion Beam Scanning Electron Microscope
Tetsuo Sakamoto
32. Force Curve
Akinori Kogure
33. Force Spectroscopy
Christina Puckert, Michael J. Higgins
34. Frequency-Modulation Atomic Force Microscopy
Masayuki Abe
35. Gap-Mode Raman Spectroscopy
Katsuyoshi Ikeda
36. Glow Discharge Mass Spectrometry
Takashi Saka
37. Glow Discharge Optical Emission Spectrometry
Patrick Chapon, Sofia Gaiaschi, Kenichi Shimizu
38. Hard X-Ray Photoelectron Spectroscopy
Akira Sekiyama
39. Helium Atom Scattering
Takahiro Kondo
40. High-Resolution Elastic Recoil Detection Analysis
Kaoru Nakajima
41. High-Resolution Electron Energy Loss Spectroscopy
Hiroshi Okuyama
42. High-Resolution Rutherford Backscattering Spectrometry
Kaoru Nakajima
43. High-Speed Atomic Force Microscopy
Takayuki Uchihashi
44. Imaging Ellipsometry
Akiko N. Itakura
45. Impact Collision Ion Scattering Spectroscopy
Masakazu Aono, Mitsuhiro Katayama
46. Inelastic Electron Tunneling Spectroscopy
Akitoshi Shiotari
47. Infrared External-Reflection Spectroscopy
Takeshi Hasegawa
48. Infrared Reflection–Absorption Spectroscopy
Jun Yoshinobu
49. Interferometer Displacement Measurement
Masaya Toda
50. Inverse Photoemission Spectroscopy
Kaname Kanai
51. Kelvin Probe Force Microscope
Risa Fuji
52. Laser Ionization Secondary Neutral Mass Spectrometry
Tetsuo Sakamoto
53. Laser Photoelectron Spectroscopy
Ryuichi Arafune
54. Lateral Force Microscopy
Shiho Moriguchi
55. Liquid SPM/AFM
Akinori Kogure
56. Low-Energy Ion Scattering Spectroscopy
Kenji Umezawa
57. Low-Energy Electron Diffraction
Yoshimi Horio
58. Low-Energy Electron Microscope
H. Hibino
59. Magnetic Force Microscopy
Masato Hirade
60. Matrix-Assisted Laser Desorption/Ionization
Takaya Satoh
61. Medium-Energy Ion Scattering
Tomoaki Nishimura
62. Micro-Raman Spectroscopy
Katsumasa Fujita
63. Microprobe Reflection High-Energy Electron Diffraction
Masakazu Ichikawa
64. Multiple-Probe Scanning Probe Microscope
Tomonobu Nakayama
65. Nanoscale Angle-Resolved Photoelectron Spectroscopy
Koji Horiba
66. Nonlinear Spectroscopy
Shoichi Yamaguchi
67. Nuclear Reaction Analysis
Markus Wilde, Katsuyuki Fukutani
68. Optical Microscopy
Kazuya Kabayama, Ryugo Tero
69. Optical Second-Harmonic Generation Spectroscopy and Microscopy
Khuat Thi Thu Hien, Goro Mizutani
70. Particle-Induced X-Ray Emission
Koichiro Sera
71. Penning Ionization Electron Spectroscopy
Takuya Hosokai
72. Phase Mode SPM/AFM
Hideo Nakajima
73. Photoelectron Diffraction
Fumihiko Matsui, Tomohiro Matsushita
74. Photoelectron Holography
Tomohiro Matsushita, Fumihiko Matsui
75. Photoelectron Yield Spectroscopy
Hisao Ishii
76. Photoemission Electron Microscope
Toyohiko Kinoshita
77. Photoluminescence
Yuhei Miyauchi
78. Photon Emission from the Scanning Tunneling Microscope
Makoto Sakurai
79. Photo-Stimulated Desorption
Akihiko Ikeda, Katsuyuki Fukutani
80. Piezoresponse Force Microscope
Masato Hirade
81. Positron-Annihilation-Induced Desorption Spectroscopy
Takayuki Tachibana, Yasuyuki Nagashima
82. p-Polarized Multiple-angle Incidence Resolution Spectrometry
Takeshi Hasegawa
83. Quartz Crystal Microbalance
Yuji Teramura, Madoka Takai
84. Reflectance Difference Spectroscopy
Ken-ichi Shudo, Shin-ya Ohno
85. Reflection High-Energy Electron Diffraction
Yoshimi Horio
86. Resonant Inelastic X-Ray Scattering
Yoshihisa Harada
87. Rutherford Backscattering Spectrometry
Daiichiro Sekiba
88. Scanning Capacitance Microscopy
Nobuyuki Nakagiri
89. Scanning Electrochemical Microscopy
Yasufumi Takahashi
90. Scanning Electron Microscope Energy Dispersive X-Ray Spectrometry
Masaki Morita
91. Scanning Electron Microscopy
Yasuyuki Okano
92. Scanning Helium Ion Microscope
Keiko Onishi, Daisuke Fujita
93. Scanning Near-Field Optical Microscopy/Near-Field Scanning Optical Microscopy
Tetsuya Narushima
94. Scanning Probe Microscopy
Ken Nakajima
95. Scanning Transmission Electron Microscopy
Koji Kimoto
96. Scanning Transmission X-Ray Microscopy
Yasuo Takeichi
97. Scanning Tunneling Microscopy
Yukio Hasegawa
98. Scanning Tunneling Spectroscopy
Keisuke Sagisaka
99. Soft X-Ray Absorption Fine Structure
Kenta Amemiya
100. Spectroscopic Ellipsometry
Takumi Moriyama
101. Spin- and Angle-Resolved Photoelectron Spectroscopy
Taichi Okuda
102. Spin-Polarized Scanning Electron Microscopy
Teruo Kohashi
103. Spin-Polarized Scanning Tunneling Microscopy
Toyo Kazu Yamada
104. Spin-Resolved Photoemission Electron Microscopy
Keiki Fukumoto
105. Super-Resolution Microscopy
Kazuya Kabayama, Ryugo Tero
106. Surface Acoustic Wave
Shinya Sasaki
107. Surface Enhanced Raman Scattering
Katsuyoshi Ikeda
108. Surface Magneto-Optic Kerr Effect
Takeshi Nakagawa
109. Surface Plasmon Resonance
Kaoru Tamada
110. Surface Profilometer
Masahiro Tosa
111. Surface Sensitive Scanning Electron Microscopy
Yoshikazu Homma
112. Surface X-Ray Diffraction
Etsuo Arakawa
113. Surface-Enhanced Infrared Absorption Spectroscopy
Masatoshi Osawa
114. Synchrotron Radiation Photoelectron Spectroscopy
Jun Fujii
115. Synchrotron Scanning Tunneling Microscope
Toyoaki Eguchi
116. Thermal Desorption Spectroscopy
Shohei Ogura, Katsuyuki Fukutani
117. Time-of-Flight Secondary Ion Mass Spectrometry
Satoka Aoyagi
118. Time-Resolved Photoelectron Spectroscopy
Iwao Matsuda
119. Time-Resolved Photoemission Electron Microscopy
Atsushi Kubo
120. Time-Resolved Scanning Tunneling Microscopy
Hidemi Shigekawa
121. Tip-Enhanced Raman Scattering
Norihiko Hayazawa
122. Total Reflection X-Ray Fluorescence
Jun Kawai
123. Transmission Electron Diffraction
Yoshio Matsui
124. Transmission Electron Microscope
Masanori Mitome
125. Ultraviolet Photoelectron Spectroscopy
Kenichi Ozawa
126. Ultraviolet–Visible Spectrophotometry
Hiro Amekura
127. Vibrational Sum Frequency Generation Spectroscopy
Satoshi Nihonyanagi, Tahei Tahara
128. X-Ray Absorption Near Edge Structure
Hitoshi Abe
129. X-Ray-Aided Noncontact Atomic Force Microscopy
Shushi Suzuki, Wang-Jae Chun, Masaharu Nomura, Kiyotaka Asakura
130. X-Ray Crystal Truncation Rod Scattering
Tetsuroh Shirasawa
131. X-Ray Magnetic Circular Dichroism
Kenta Amemiya
132. X-Ray Photoelectron Spectroscopy
Makoto Nakamura
133. X-Ray Reflectivity
Wolfgang Voegeli
134. X-Ray Standing Wave Method
Akira Saito
Avainsanat: Materials Science, Characterization and Evaluation of Materials, Spectroscopy/Spectrometry, Spectroscopy and Microscopy, Surface and Interface Science, Thin Films, Surfaces and Interfaces, Thin Films
- Toimittaja
- Japan, The Surface Science Society of
- Julkaisija
- Springer
- Julkaisuvuosi
- 2018
- Kieli
- en
- Painos
- 1
- Sivumäärä
- 16 sivua
- Kategoria
- Tekniikka, energia, liikenne
- Tiedostomuoto
- E-kirja
- eISBN (PDF)
- 9789811061561
- Painetun ISBN
- 978-981-10-6155-4