Jen, Tsung-Hau
Educational Measurement for Applied Researchers
1. What Is Measurement?
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen
2. Construct, Framework and Test Development—From IRT Perspectives
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen
3. Test Design
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen
4. Test Administration and Data Preparation
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen
5. Classical Test Theory
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen
6. An Ideal Measurement
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen
7. Rasch Model (The Dichotomous Case)
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen
8. Residual-Based Fit Statistics
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen
9. Partial Credit Model
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen
10. Two-Parameter IRT Models
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen
11. Differential Item Function
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen
12. Equating
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen
13. Facets Models
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen
14. Bayesian IRT Models (MML Estimation)
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen
15. Multidimensional IRT Models
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen
Avainsanat: Statistics, Statistical Theory and Methods, Statistics for Social Science, Behavorial Science, Education, Public Policy, and Law, Assessment, Testing and Evaluation, Mathematics in the Humanities and Social Sciences, Mathematical Software
- Tekijä(t)
- Jen, Tsung-Hau
- Tam, Hak Ping
- Wu, Margaret
- Julkaisija
- Springer
- Julkaisuvuosi
- 2016
- Kieli
- en
- Painos
- 1
- Sivumäärä
- 14 sivua
- Kategoria
- Eksaktit luonnontieteet
- Tiedostomuoto
- E-kirja
- eISBN (PDF)
- 9789811033025
- Painetun ISBN
- 978-981-10-3300-1