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Benediktovich, Andrei

Theoretical Concepts of X-Ray Nanoscale Analysis

Benediktovich, Andrei - Theoretical Concepts of X-Ray Nanoscale Analysis, e-kirja

155,60€

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ISBN: 9783642381775
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Table of contents

1. Basic Principles of the Interaction of X-Rays with Matter: Quantum Electrodynamical Analysis
Andrei Benediktovitch, Ilya Feranchuk, Alexander Ulyanenkov

2. The Theory of X-Ray Scattering fromMacroscopical Objects
Andrei Benediktovitch, Ilya Feranchuk, Alexander Ulyanenkov

3. X-Ray Reflectivity
Andrei Benediktovitch, Ilya Feranchuk, Alexander Ulyanenkov

4. X-Ray Diffraction in Ideal Crystals
Andrei Benediktovitch, Ilya Feranchuk, Alexander Ulyanenkov

5. Diffuse X-Ray Scattering from Imperfect Surfaces and Interfaces
Andrei Benediktovitch, Ilya Feranchuk, Alexander Ulyanenkov

6. X-Ray Diffraction from Crystals with Defects
Andrei Benediktovitch, Ilya Feranchuk, Alexander Ulyanenkov

7. X-Ray Diffraction Residual Stress Analysis in Polycrystals
Andrei Benediktovitch, Ilya Feranchuk, Alexander Ulyanenkov

Avainsanat: Physics, Measurement Science and Instrumentation, Characterization and Evaluation of Materials, Theoretical, Mathematical and Computational Physics, Applied and Technical Physics, Spectroscopy and Microscopy

Tekijä(t)
 
 
Julkaisija
Springer
Julkaisuvuosi
2014
Kieli
en
Painos
2014
Sarja
Springer Series in Materials Science
Sivumäärä
13 sivua
Kategoria
Eksaktit luonnontieteet
Tiedostomuoto
E-kirja
eISBN (PDF)
9783642381775

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