Atomic Scale Interconnection Machines

1. High Precision Local Electrical Probing: Potential and Limitations for the Analysis of Nanocontacts and Nanointerconnects
B. Guenther, M. Maier, J. Koeble, A. Bettac, F. Matthes, C. M. Schneider, A. Feltz

2. Ultra-Compact Multitip Scanning Probe Microscope with an Outer Diameter of 50mm
Vasily Cherepanov, Evgeny Zubkov, Hubertus Junker, Stefan Korte, Marcus Blab, Peter Coenen, Bert Voigtländer

3. Atomic Scale Interconnection Machine
O. A. Neucheva, R. Thamankar, T. L. Yap, C. Troadec, J. Deng, C. Joachim

4. The DUF Project: A UHV Factory for Multi-Interconnection of a Molecule Logic Gates on Insulating Substrate
D. Martrou, L. Guiraud, R. Laloo, B. Pecassou, P. Abeilhou, O. Guillermet, E. Dujardin, S. Gauthier, J. Polesel Maris, M. Venegas, A. Hinault, A. Bodin, F. Chaumeton, A. Piednoir, H. Guo, T. Leoni

5. Challenges and Advances in Instrumentation of UHV LT Multi-Probe SPM System
Zhouhang Wang

6. On the Road to Multi-Probe Non-Contact AFM
T. Vančura, S. Schmitt, V. Friedli, S. Torbrügge, O. Schaff

7. Atomically Precise Manufacturing: The Opportunity, Challenges, and Impact
John N. Randall, James R. Ehr, Joshua Ballard, James Owen, Rahul Saini, Ehud Fuchs, Hai Xu, Shi Chen

8. Combined STM and Four-Probe Resistivity Measurements on Single Semiconductor Nanowires
M. Berthe, C. Durand, T. Xu, J. P. Nys, P. Caroff, B. Grandidier

9. Probing Electronic Transport of Individual Nanostructures with Atomic Precision
Shengyong Qin, An-Ping Li

10. Surface Conductance Measurements on a MoS2 Surface Using a UHV-Nanoprobe System
R. Thamankar, O. A. Neucheva, T. L. Yap, C. Joachim

11. Multi-Probe Characterization of 1D and 2D Nanostructures Assembled on Ge(001) Surface by Gold Atom Deposition and Annealing
M. Wojtaszek, M. Kolmer, S. Godlewski, J. Budzioch, B. Such, F. Krok, M. Szymonski

12. Nanometer-Scale Four-Point Probe Resistance Measurements of Individual Nanowires by Four-Tip STM
S. Hasegawa, T. Hirahara, Y. Kitaoka, S. Yoshimoto, T. Tono, T. Ohba

13. Silicon Surface Conductance Investigated Using a Multiple-Probe Scanning Tunneling Microscope
Janik Zikovsky, Mark H. Salomons, Stanislav A. Dogel, Robert A. Wolkow

14. Atomic-Scale Devices in Silicon by Scanning Tunneling Microscopy
J. A. Miwa, M. Y. Simmons

15. Electronic Transport on the Nanoscale
C. A. Bobisch, A. M. Bernhart, M. R. Kaspers, M. C. Cottin, J. Schaffert, R. Möller

16. Solid State Nano Gears Manipulations
Cedric Troadec, Jie Deng, Francisco Ample, Ramesh Thamankar, Christian Joachim

17. Probing Single Molecular Motors on Solid Surface
Haiming Guo, Yeliang Wang, Min Feng, Li Gao, Hongjun Gao

Avainsanat: Physics, Nanoscale Science and Technology, Nanotechnology and Microengineering, Nanochemistry, Nanotechnology, Quantum Information Technology, Spintronics