Acoustic Scanning Probe Microscopy

1. Acoustic Scanning Probe Microscopy: An Overview
D. Passeri, F. Marinello

2. Contact, Interactions, and Dynamics
E. Barthel

3. Cantilever Dynamics: Theoretical Modeling
John H. Cantrell, Sean A. Cantrell

4. One-Dimensional Finite Element Modeling of AFM Cantilevers
Richard Arinero, Gérard Lévêque

5. Atomic Force Acoustic Microscopy
U. Rabe, M. Kopycinska-Müller, S. Hirsekorn

6. Ultrasonic Atomic Force Microscopy UAFM
Kazushi Yamanaka, Toshihiro Tsuji

7. Enhanced Sensitivity of AFAM and UAFM by Concentrated-Mass Cantilevers
Mikio Muraoka

8. Scanning Microdeformation Microscopy: Advances in Quantitative Micro- and Nanometrology
P. Vairac, J. Le Rouzic, P. Delobelle, B. Cretin

9. Ultrasonic Force Microscopies
Oleg Kolosov, Andrew Briggs

10. Scanning Near-Field Ultrasound Holography
Shraddha Avasthy, Gajendra S. Shekhawat, Vinayak P. Dravid

11. Mapping of the Surface’s Mechanical Properties Through Analysis of Torsional Cantilever Bending in Dynamic Force Microscopy
Andrzej Sikora, Łukasz Bednarz

12. Quantitative Measurements of Elastic Properties with Ultrasonic-Based AFM and Conventional Techniques
D. C. Hurley

13. Data Processing for Acoustic Probe Microscopy Techniques
F. Marinello, D. Passeri, P. Schiavuta, E. Savio

14. Friction and Internal Friction Measurements by Atomic Force Acoustic Microscopy
A. Caron, W. Arnold

15. Quantitative Subsurface Imaging by Acoustic AFM Techniques
Zehra Parlak, Levent F. Degertekin

16. Polymer Material Characterization by Acoustic Force Microscopy
Chad S. Korach

17. Application of Acoustic Techniques for Characterization of Biological Samples
Bernhard R. Tittmann, Anne Ebert

Avainsanat: Physics, Laser Technology, Photonics, Nanotechnology and Microengineering, Acoustics, Nanotechnology, Characterization and Evaluation of Materials, Surfaces and Interfaces, Thin Films