Noncontact Atomic Force Microscopy

1. Introduction
Seizo Morita

2. Method for Precise Force Measurements
Masayuki Abe, Ken-ichi Morita

3. Force Spectroscopy on Semiconductor Surfaces
Oscar Custance, Noriaki Oyabu, Yoshiaki Sugimoto

4. Tip–Sample Interactions as a Function of Distance on Insulating Surfaces
Regina Hoffmann

5. Force Field Spectroscopy in Three Dimensions
André Schirmeisen, Hendrik Hölscher, Udo D. Schwarz

6. Principles and Applications of the qPlus Sensor
Franz J. Giessibl

7. Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond
M. Heyde, G. H. Simon, T. König

8. Atom Manipulation on Semiconductor Surfaces
Yoshiaki Sugimoto

9. Atomic Manipulation on Metal Surfaces
Markus Ternes, Christopher P. Lutz, Andreas J. Heinrich

10. Atomic Manipulation on an Insulator Surface
Sabine Hirth, Frank Ostendorf, Michael Reichling

11. Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM
Pablo Pou, Pavel Jelínek, Rubén Pérez

12. Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces
T. Trevethan, N. Martsinovich, L. Kantorovich, A. L. Shluger

13. Magnetic Exchange Force Microscopy
Alexander Schwarz, Uwe Kaiser, Rene Schmidt, Roland Wiesendanger

14. First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001)
Cesar Lazo, Hendrik Hölscher, Vasile Caciuc, Stefan Heinze

15. Frequency Modulation Atomic Force Microscopy in Liquids
Kei Kobayashi, Hirofumi Yamada

16. Biological Applications of FM-AFM in Liquid Environment
Takeshi Fukuma, Suzanne P. Jarvis

17. High-Frequency Low Amplitude Atomic Force Microscopy
Hideki Kawakatsu, Shuhei Nishida, Dai Kobayashi, Kazuhisa Nakagawa, Shigeki Kawai

18. Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy
A. Raman, R. Reifenberger, J. Melcher, R. Tung

Avainsanat: Material Science, Nanotechnology, Engineering, general, Condensed Matter Physics