Handbook of Practical X-Ray Fluorescence Analysis

1. Introduction
Tomoya Arai

2. X-Ray Sources
Norbert Langhoff, Alexandre Simionovici, Vladimir Arkadiev, Wolfgang Knüpfer, Tomáš ?echák, Jürgen Leonhardt, Joël Chavanne

3. X-Ray Optics
Alexei Erko, Vladimir Arkadiev, Aniouar Bjeoumikhov, Alexander Antonov, Burkhard Beckhoff, Inna Grigorieva, habil. Birgit Kanngießer, Bernard Vidal

4. X-Ray Detectors and XRF Detection Channels
Frank Scholze, Antonio Longoni, Carlo Fiorini, Lothar Strüder, Norbert Meidinger, Robert Hartmann, Naoki Kawahara, Takashi Shoji

5. Quantitative Analysis
Michael Mantler, James Willis, Gerald Lachance, Bruno A. R. Vrebos, Karl-Eugen Mauser, Naoki Kawahara, Richard M. Rousseau, Peter N. Brouwer

6. Specimen Preparation
Jasna Injuk, RenÉ Grieken, Avram Blank, Lyudmyla Eksperiandova, Victor Buhrke

7. Methodological Developments and Applications
Birgit Kanngießer, Michael Haschke, Alexandre Simionovici, Pierre Chevallier, Christina Streli, Peter Wobrauschek, Laszlo Fabry, Siegfried Pahlke, Fabio Comin, Ray Barrett, Pietro Pianetta, Katharina Lüning, Burkhard Beckhoff, Volker Rößiger, Bernd Nensel, Sandor Kurunczi, János Osán, Szabina Török, Maria Betti, Dieter Rammlmair, Max Wilke, Karen Rickers, Robert A. Schwarzer, Andreas Möller, Antje Wittenberg, Oliver Hahn, Ina Reiche, Heike Stege, Jörg Engelhardt, Janina Zieba-Palus, Gundolf Weseloh, Susanne Staub, Joachim Feuerborn, Peter Hoffmann

8. Appendix
Peter Ambrosi, Reiner Wedell, Wolfgang Malzer

Avainsanat: Chemistry, Characterization and Evaluation of Materials, Solid State Physics and Spectroscopy, Condensed Matter, Surfaces and Interfaces, Thin Films, Physical Chemistry