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Padilla, Moises

Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications

Padilla, Moises - Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications, e-kirja

124,30€

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ISBN: 9783527681105
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The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.

Avainsanat: interferometry; practical; opticalmetrology; classical; book; theoretical principles; applications; novelty; major; frequency; work; function; transfer; stochastic; theory; use; ftf; phase; response; spectral; demodulation algorithms, Sensors, Instrumentation & Measurement, Spectroscopy, Sensors, Instrumentation & Measurement, Spectroscopy

Tekijä(t)
 
 
Julkaisija
John Wiley and Sons, Inc.
Julkaisuvuosi
2014
Kieli
en
Painos
1
Sivumäärä
344 sivua
Kategoria
Eksaktit luonnontieteet
Tiedostomuoto
E-kirja
eISBN (ePUB)
9783527681105
Painetun ISBN
9783527411528

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