Contactless VLSI Measurement and Testing Techniques

1. Conventional Test Methods
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2. Testability Design
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3. Other Techniques Based on the Contacting Probe
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4. Contactless Testing
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5. Electron Beam and Photoemission Probing
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6. Electro-Optic Sampling and Charge-Density Probe
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7. Electric Force Microscope, Capacitive Coupling, and Scanning Magnetoresistive Probe
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8. Probing Techniques Based on Light Emission from Chip
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9. All-Silicon Optical Technology for Contactless Testing of Integrated Circuits
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10. Comparison of Contactless Testing Methodologies
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Avainsanat: Engineering, Circuits and Systems, Processor Architectures, Electronics and Microelectronics, Instrumentation