Celano, Umberto
Metrology and Physical Mechanisms in New Generation Ionic Devices
Table of contents
1. Introduction
Umberto Celano
2. Filamentary-Based Resistive Switching
Umberto Celano
3. Nanoscaled Electrical Characterization
Umberto Celano
4. Conductive Filaments: Formation, Observation and Manipulation
Umberto Celano
5. Three-Dimensional Filament Observation
Umberto Celano
6. Reliability Threats in CBRAM
Umberto Celano
7. Conclusions and Outlook
Umberto Celano
Avainsanat: Physics, Spectroscopy and Microscopy, Nanotechnology and Microengineering, Characterization and Evaluation of Materials
- Tekijä(t)
- Celano, Umberto
- Julkaisija
- Springer
- Julkaisuvuosi
- 2016
- Kieli
- en
- Painos
- 1
- Sarja
- Springer Theses
- Sivumäärä
- 24 sivua
- Kategoria
- Eksaktit luonnontieteet
- Tiedostomuoto
- E-kirja
- eISBN (PDF)
- 9783319395319
- Painetun ISBN
- 978-3-319-39530-2
