Nanometer-scale Defect Detection Using Polarized Light

This book describes experimental and theoretical methods that are implemented within the framework of fundamental research to better understand physical and chemical processes at the nanoscale that are responsible for the remarkable properties of materials used in innovative technological devices. It presents optical techniques based on polarized light allowing the characterization of defects in materials or in their interfaces that are likely to impact performance. It also describes ways of knowing mechanical properties of nanomaterials by using theoretical models and analysis of experimental results and their uncertainties.

Avainsanat: Nanophysics