He, Ming
Metal-Dielectric Interfaces in Gigascale Electronics
1. Introduction
Ming He, Toh-Ming Lu
2. Metal–Dielectric Diffusion Processes: Fundamentals
Ming He, Toh-Ming Lu
3. Experimental Techniques
Ming He, Toh-Ming Lu
4. Al-Dielectric Interfaces
Ming He, Toh-Ming Lu
5. Cu-Dielectric Interfaces
Ming He, Toh-Ming Lu
6. Barrier Metal–Dielectric Interfaces
Ming He, Toh-Ming Lu
7. Self-Forming Barriers
Ming He, Toh-Ming Lu
8. Kinetics of Ion Drift
Ming He, Toh-Ming Lu
9. Time-Dependent Dielectric Breakdown (TDDB) and Future Directions
Ming He, Toh-Ming Lu
Avainsanat: Engineering, Electronics and Microelectronics, Instrumentation, Optical and Electronic Materials, Surface and Interface Science, Thin Films, Nanotechnology and Microengineering, Electrochemistry, Engineering Thermodynamics, Heat and Mass Transfer
- Tekijä(t)
- He, Ming
- Lu, Toh-Ming
- Julkaisija
- Springer
- Julkaisuvuosi
- 2012
- Kieli
- en
- Painos
- 1
- Sarja
- Springer Series in Materials Science
- Sivumäärä
- 11 sivua
- Kategoria
- Tekniikka, energia, liikenne
- Tiedostomuoto
- E-kirja
- eISBN (PDF)
- 9781461418122