Pavlov, Andrei
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Table of contents
1. Introduction and Motivation
2. SRAM Circuit Design and Operation
3. SRAM Cell Stability: Definition, Modeling and Testing
4. Traditional SRAM Fault Models and Test Practices
5. Techniques for Detection of SRAM Cells with Stability Faults
6. Soft Errors in SRAMs: Sources, Mechanisms and Mitigation Techniques
DRM-restrictions
Printing: not available
Clipboard copying: not available
Avainsanat: TECHNOLOGY & ENGINEERING / General TEC000000
- Tekijä(t)
- Pavlov, Andrei
- Sachdev, Manoj
- Julkaisija
- Springer
- Julkaisuvuosi
- 2008
- Kieli
- en
- Painos
- 1
- Kategoria
- Tekniikka, energia, liikenne
- Tiedostomuoto
- E-kirja
- eISBN (PDF)
- 9781402083631
