Total-Reflection X-Ray Fluorescence Analysis and Related Methods

Explores the uses of TXRF in micro- and trace analysis, and in surface- and near-surface-layer analysis
•Pinpoints new applications of TRXF in different fields of biology, biomonitoring, material and life sciences, medicine, toxicology, forensics, art history, and archaeometry
•Updated and detailed sections on sample preparation taking into account nano- and picoliter techniques
•Offers helpful tips on performing analyses, including sample preparations, and spectra recording and interpretation
•Includes some 700 references for further study

Avainsanat: Total-Reflection X-Ray Fluorescence Analysis; Reinhold Klockenkamper; Silicon-drift detector with Peltier-cooling; simple wavelength-dispersive X-ray spectrometer; TXRF; EXAFS; XANES, Materials Characterization, Physical Chemistry, Materials Characterization, Physical Chemistry