Single Event Effects in Aerospace

This book introduces the basic concepts necessary to understand Single Event phenomena which could cause random performance errors and catastrophic failures to electronics devices. As miniaturization of electronics components advances, electronics components are more susceptible in the radiation environment. The book includes a discussion of the radiation environments in space and in the atmosphere, radiation rate prediction depending on the orbit to allow electronics engineers to design and select radiation tolerant components and systems, and single event prediction.

Avainsanat: Cross Sections; Heavy Ions; Rate Predictions; Semiconductor device radiation effects; Single event characterization; Single event charge collection; Single Event Effect (SEE); Single event mechanisms; Single event Modeling; Single event upset; Soft error rate; Soft errors; Space Environment, Semiconductors, Aeronautic & Aerospace Engineering, Semiconductors, Aeronautic & Aerospace Engineering