Sample Preparation Handbook for Transmission Electron Microscopy

1. Methodology: General Introduction
Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub

2. Introduction to Materials
Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub

3. The Different Observation Modes in Electron Microscopy (SEM, TEM, STEM)
Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub

4. Materials Problems and Approaches for TEM and TEM/STEM Analyses
Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub

5. Physical and Chemical Mechanisms of Preparation Techniques
Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub

6. Artifacts in Transmission Electron Microscopy
Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub

7. Selection of Preparation Techniques Based on Material Problems and TEM Analyses
Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub

8. Comparisons of Techniques
Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub

9. Conclusion: What Is a Good Sample?
Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub

Avainsanat: Materials Science, Characterization and Evaluation of Materials, Biological Microscopy, Mineralogy, Nanotechnology