Digital Noise Monitoring of Defect Origin

1. Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features
2. Position-Binary Technology of Monitoring Defect at its Origin
3. Technology of Digital Analysis of Noise as a Carrier of Information about the Beginning of a Defect's Origin
4. Robust Correlation Monitoring of a Defect at its Origin
5. Spectral Monitoring of a Defect's Origin
6. The Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier
7. The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier

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Avainsanat: TECHNOLOGY & ENGINEERING / General TEC000000