Sisäänkirjautuminen

Zhou, Weilie

Scanning Microscopy for Nanotechnology

Zhou, Weilie - Scanning Microscopy for Nanotechnology, e-kirja

126,45€

E-kirja, PDF, Adobe DRM-suojattu
ISBN: 9780387396200
DRM-rajoitukset

TulostusEi sallittu
Kopioi leikepöydälleEi sallittu

Table of contents

1. Fundamentals of Scanning Electron Microscopy (SEM)
Weilie Zhou, Robert Apkarian, Zhong Lin Wang, David Joy

2. Backscattering Detector and EBSD in Nanomaterials Characterization
Tim Maitland, Scott Sitzman

3. X-ray Microanalysis in Nanomaterials
Robert Anderhalt

4. Low kV Scanning Electron Microscopy
M. David Frey

5. E-beam Nanolithography Integrated with Scanning Electron Microscope
Joe Nabity, Lesely Anglin Compbell, Mo Zhu, Weilie Zhou

6. Scanning Transmission Electron Microscopy for Nanostructure Characterization
S. J. Pennycook, A. R. Lupini, M. Varela, A. Borisevich, Y. Peng, M. P. Oxley, K. Benthem, M. F. Chisholm

7. Introduction to In-Situ Nanomanipulation for Nanomaterials Engineering
Rishi Gupta, Richard E. Stallcup

8. Applications of FIB and DualBeam for Nanofabrication
Brandon Leer, Lucille A. Giannuzzi, Paul Anzalone

9. Nanowires and Carbon Nanotubes
Jianye Li, Jie Liu

10. Photonic Crystals and Devices
Xudong Wang, Zhong Lin Wang

11. Nanoparticles and Colloidal Self-assembly
Gabriel Caruntu, Daniela Caruntu, Charles J. O'Connor

12. Nano-building Blocks Fabricated through Templates
Feng Li, John B. Wiley

13. One-dimensional Wurtzite Semiconducting Nanostructures
Pu Xian Gao, Zhong Lin Wang

14. Bio-inspired Nanomaterials
Peng Wang, Guobao Wei, Xiaohua Liu, Peter X. Ma

15. Cryo-Temperature Stages in Nanostructural Research
Robert P. Apkarian

Avainsanat: Chemistry, Nanotechnology, Characterization and Evaluation of Materials, Optical and Electronic Materials, Measurement Science, Instrumentation

Tekijä(t)
 
Julkaisija
Springer
Julkaisuvuosi
2007
Kieli
en
Painos
1
Sivumäärä
536 sivua
Kategoria
Eksaktit luonnontieteet
Tiedostomuoto
E-kirja
eISBN (PDF)
9780387396200

Samankaltaisia e-kirjoja