Zhou, Weilie
Scanning Microscopy for Nanotechnology
1. Fundamentals of Scanning Electron Microscopy (SEM)
Weilie Zhou, Robert Apkarian, Zhong Lin Wang, David Joy
2. Backscattering Detector and EBSD in Nanomaterials Characterization
Tim Maitland, Scott Sitzman
3. X-ray Microanalysis in Nanomaterials
Robert Anderhalt
4. Low kV Scanning Electron Microscopy
M. David Frey
5. E-beam Nanolithography Integrated with Scanning Electron Microscope
Joe Nabity, Lesely Anglin Compbell, Mo Zhu, Weilie Zhou
6. Scanning Transmission Electron Microscopy for Nanostructure Characterization
S. J. Pennycook, A. R. Lupini, M. Varela, A. Borisevich, Y. Peng, M. P. Oxley, K. Benthem, M. F. Chisholm
7. Introduction to In-Situ Nanomanipulation for Nanomaterials Engineering
Rishi Gupta, Richard E. Stallcup
8. Applications of FIB and DualBeam for Nanofabrication
Brandon Leer, Lucille A. Giannuzzi, Paul Anzalone
9. Nanowires and Carbon Nanotubes
Jianye Li, Jie Liu
10. Photonic Crystals and Devices
Xudong Wang, Zhong Lin Wang
11. Nanoparticles and Colloidal Self-assembly
Gabriel Caruntu, Daniela Caruntu, Charles J. O'Connor
12. Nano-building Blocks Fabricated through Templates
Feng Li, John B. Wiley
13. One-dimensional Wurtzite Semiconducting Nanostructures
Pu Xian Gao, Zhong Lin Wang
14. Bio-inspired Nanomaterials
Peng Wang, Guobao Wei, Xiaohua Liu, Peter X. Ma
15. Cryo-Temperature Stages in Nanostructural Research
Robert P. Apkarian
Avainsanat: Chemistry, Nanotechnology, Characterization and Evaluation of Materials, Optical and Electronic Materials, Measurement Science, Instrumentation
- Tekijä(t)
- Zhou, Weilie
- Wang, Zhong Lin
- Julkaisija
- Springer
- Julkaisuvuosi
- 2007
- Kieli
- en
- Painos
- 1
- Sivumäärä
- 536 sivua
- Kategoria
- Eksaktit luonnontieteet
- Tiedostomuoto
- E-kirja
- eISBN (PDF)
- 9780387396200