Sachdev, Manoj
Thermal and Power Management of Integrated Circuits
Table of contents
1. Introduction
2. Power, Junction Temperature, and Reliability
3. Burn-in as a Reliability Screening Test
4. Thermal and Electrothermal Modeling
5. Thermal Runaway and Thermal Management
6. Low Temperature CMOS Operation
DRM-restrictions
Printing: not available
Clipboard copying: not available
Avainsanat: TECHNOLOGY & ENGINEERING / General TEC000000
- Tekijä(t)
- Sachdev, Manoj
- Vassighi, Arman
- Julkaisija
- Springer
- Julkaisuvuosi
- 2006
- Kieli
- en
- Painos
- 1
- Kategoria
- Tekniikka, energia, liikenne
- Tiedostomuoto
- E-kirja
- eISBN (PDF)
- 9780387297491