Gizopoulos / Advances in ElectronicTesting

1. Defect-Orinted Testing
Robert. C Aitken

2. Failure Mechanisms and Testing in Nanometer Technologies
Jaume Segura, Charles Hawkins, Jerry Soden

3. Silicon Debug
Doug Josephson, Bob Gottlieb

4. Delay Testing
Adam Cron

5. High-Speed Digital Test Interfaces
Wolfgang Maichen

6. DFT_Oriented,Low-Cost Testers
Al Coruch, Geir Eide

7. Embedded Cores and System-on-Chip Testing
Rubin Parekhji

8. Embedded MemoryTesting
R. Dean Adams

9. Mixed-Signal Testing and DfT
Stephen Sunter

10. RF Testing
Randy Wolf, Mustapha Slamani, John Ferrario, Jayendra Bhagat

11. Loaded Board Testing
Kenneth P. Parker

DRM-restrictions

Printing: not available
Clipboard copying: not available

Avainsanat: TECHNOLOGY & ENGINEERING / General TEC000000