Dynamic Characterisation of Analogue-to-Digital Converters

I.ADC Characterisation Based on Sinewave Analysis

1. ADC Applications, Architectures and Terminology
José Machado Silva, Hélio Mendonça

2. Sinewave Test Setup
Pierre-Yves Roy, Jacques Durand

3. Time-Domain Data Analysis
Dominique Dallet, Djamel Haddadi, Philippe Marchegay

4. Frequency-Domain Data Analysis
Pierre-Yves Roy, Jacques Durand

5. Code Histogram Test
Giovanni Chiorboli, Carlo Morandi

6. Comparative Study of ADC Sinewave Test Methods
José Machado Silva, Hélio Mendonça, Sara Mazoleni

II.Measurement of Additional Parameters

7. Jitter Measurement
Pierre-Yves Roy, Jacques Durand

8. Differential Gain and Phase Testing
José Machado Silva, Hélio Mendonça

9. Step and Transient Response Measurement
Giovanni Chiorboli, Carlo Morandi

10. Hysteresis Measurement
Giovanni Chiorboli, Carlo Morandi

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Avainsanat: TECHNOLOGY & ENGINEERING / General TEC000000