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Amelinckx, S. - Electron Microscopy: Principles and Fundamentals, ebook

Electron Microscopy: Principles and Fundamentals

Amelinckx, S.


Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the

Brydson, Rik - Aberration-corrected Analytical Electron Microscopy, ebook

Aberration-corrected Analytical Electron Microscopy

Brydson, Rik


This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy

Carlton, Robert Allen - Pharmaceutical Microscopy, ebook

Pharmaceutical Microscopy

Carlton, Robert Allen


Scanning Electron Microscopy and Energy-Dispersive X-Ray Spectrometry
Robert Allen Carlton
5. Infrared and Raman Microscopy
Robert Allen Carlton
6. Specialized Microscopy Techniques
Robert Allen Carlton
7. Image Analysis
Robert Allen Carlton

Dieing, Thomas - Confocal Raman Microscopy, ebook

Confocal Raman Microscopy

Dieing, Thomas


Nano-spectroscopy of Individual Carbon Nanotubes and Isolated Graphene Sheets
Alain Jungen
8. Characterization of Graphene by Confocal Raman Spectroscopy
Christoph Neumann, Christoph Stampfer
9. Low Frequency Raman Scattering of Two-Dimensional Materials

Glatzel, Thilo - Kelvin Probe Force Microscopy, ebook

Kelvin Probe Force Microscopy

Glatzel, Thilo


Dynamic Modes in Kelvin Probe Force Microscopy: Band Excitation and G-Mode
Stephen Jesse, Liam Collins, Sabine Neumayer, Suhas Somnath, Sergei V. Kalinin
4. Practical Aspects of Kelvin Probe Force Microscopy in Liquids
Kei Kobayashi, Hirofumi Yamada

Gölzhäuser, Armin - Helium Ion Microscopy, ebook

Helium Ion Microscopy

Gölzhäuser, Armin


Helium Ion Microscopy of Carbon Nanomembranes
Armin Gölzhäuser
11. Helium Ion Microscopy for Two-Dimensional Materials
Yangbo Zhou, Daniel S. Fox, Hongzhou Zhang
Part III. Analysis
12. Backscattering Spectrometry

Gruverman, Alexei - Scanning Probe Microscopy, ebook

Scanning Probe Microscopy

Gruverman, Alexei


Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics
J. J. Kopanski
5. Principles of Kelvin Probe Force Microscopy
Th. Glatzel, M.Ch. Lux-Steiner, E. Strassburg, A. Boag, Y. Rosenwaks
6. Frequency-Dependent