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Amelinckx, S. - Electron Microscopy: Principles and Fundamentals, ebook

Electron Microscopy: Principles and Fundamentals

Amelinckx, S.

238,10€

Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the

Brydson, Rik - Aberration-corrected Analytical Electron Microscopy, ebook

Aberration-corrected Analytical Electron Microscopy

Brydson, Rik

59,50€

This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy

Carlton, Robert Allen - Pharmaceutical Microscopy, ebook

Pharmaceutical Microscopy

Carlton, Robert Allen

160,15€

Scanning Electron Microscopy and Energy-Dispersive X-Ray Spectrometry
Robert Allen Carlton
5. Infrared and Raman Microscopy
Robert Allen Carlton
6. Specialized Microscopy Techniques
Robert Allen Carlton
7. Image Analysis
Robert Allen Carlton
8.

Dieing, Thomas - Confocal Raman Microscopy, ebook

Confocal Raman Microscopy

Dieing, Thomas

199,90€

Nano-spectroscopy of Individual Carbon Nanotubes and Isolated Graphene Sheets
Alain Jungen
8. Characterization of Graphene by Confocal Raman Spectroscopy
Christoph Neumann, Christoph Stampfer
9. Low Frequency Raman Scattering of Two-Dimensional Materials

Glatzel, Thilo - Kelvin Probe Force Microscopy, ebook

Kelvin Probe Force Microscopy

Glatzel, Thilo

184,50€

Dynamic Modes in Kelvin Probe Force Microscopy: Band Excitation and G-Mode
Stephen Jesse, Liam Collins, Sabine Neumayer, Suhas Somnath, Sergei V. Kalinin
4. Practical Aspects of Kelvin Probe Force Microscopy in Liquids
Kei Kobayashi, Hirofumi Yamada
5.

Gölzhäuser, Armin - Helium Ion Microscopy, ebook

Helium Ion Microscopy

Gölzhäuser, Armin

230,65€

Helium Ion Microscopy of Carbon Nanomembranes
Armin Gölzhäuser
11. Helium Ion Microscopy for Two-Dimensional Materials
Yangbo Zhou, Daniel S. Fox, Hongzhou Zhang
Part III. Analysis
12. Backscattering Spectrometry

Gruverman, Alexei - Scanning Probe Microscopy, ebook

Scanning Probe Microscopy

Gruverman, Alexei

408,00€

Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics
J. J. Kopanski
5. Principles of Kelvin Probe Force Microscopy
Th. Glatzel, M.Ch. Lux-Steiner, E. Strassburg, A. Boag, Y. Rosenwaks
6. Frequency-Dependent