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Ibe, Eishi H.

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Kanekawa, Nobuyasu - Dependability in Electronic Systems, ebook

Dependability in Electronic Systems

Kanekawa, Nobuyasu

109,95€

Ibe, Eishi H. - Terrestrial Radiation Effects in ULSI Devices and Electronic Systems, ebook

Terrestrial Radiation Effects in ULSI Devices and Electronic Systems

136,75€

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