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Tan, Cher Ming

Electromigration Modeling at Circuit Layout Level

Tan, Cher Ming - Electromigration Modeling at Circuit Layout Level, ebook

65,55€

Ebook, PDF with Adobe DRM
ISBN: 9789814451215
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Table of contents

1. Introduction
Cher Ming Tan, Feifei He

2. 3D Circuit Model Construction and Simulation
Cher Ming Tan, Feifei He

3. Comparison of EM Performances in Circuit and Test Structures
Cher Ming Tan, Feifei He

4. Interconnect EM Reliability Modeling at Circuit Layout Level
Cher Ming Tan, Feifei He

5. Concluding Remarks
Cher Ming Tan, Feifei He

Keywords: Engineering, Quality Control, Reliability, Safety and Risk, Electronic Circuits and Devices, Atomic, Molecular, Optical and Plasma Physics

Author(s)
 
Publisher
Springer
Publication year
2013
Language
en
Edition
2013
Series
SpringerBriefs in Applied Sciences and Technology
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (PDF)
9789814451215

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