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Japan, The Surface Science Society of

Compendium of Surface and Interface Analysis

Japan, The Surface Science Society of - Compendium of Surface and Interface Analysis, ebook

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ISBN: 9789811061561
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Table of contents

1. Acoustic Microscopy
Naohiro Hozumi

2. Action Spectroscopy with STM
Kenta Motobayashi

3. Ambient Pressure X-Ray Photoelectron Spectroscopy
Hiroshi Kondoh

4. Angle-Resolved Ultraviolet Photoelectron Spectroscopy
Takafumi Sato

5. Atom Probe Field Ion Microscope
Masahiko Tomitori

6. Atomic Force Microscope
Shintaro Fujii

7. Auger Electron Spectroscopy
Fumihiko Matsui

8. Cathodoluminescence
Takashi Sekiguchi

9. Conductive Atomic Force Microscopy
Risa Fuji

10. Differential Interference Contrast Microscopy/Phase-Contrast Microscopy
Hiroshi Komatsu, Gen Sazaki

11. Dynamic Secondary Ion Mass Spectrometry
Mitsuhiro Tomita

12. Elastic Recoil Detection Analysis
Daiichiro Sekiba

13. Electrochemical Atomic Force Microscopy
Toru Utsunomiya, Yasuyuki Yokota, Ken-ichi Fukui

14. Electrochemical Infrared Spectroscopy
Shen Ye

15. Electrochemical Scanning Tunneling Microscopy
Tomoaki Nishino

16. Electrochemical Second Harmonic Generation
Ichizo Yagi

17. Electrochemical Sum Frequency Generation
Hidenori Noguchi

18. Electrochemical Surface X-Ray Scattering
Toshihiro Kondo

19. Electrochemical Transmission Electron Microscopy
Yoshifumi Oshima

20. Electrochemical X-Ray Absorption Fine Structure
Takuya Masuda

21. Electrochemical X-Ray Photoelectron Spectroscopy
Takuya Masuda

22. Electron Backscatter Diffraction
Rika Yoda

23. Electron Energy-Loss Spectroscopy
Tadaaki Nagao

24. Electron Probe Microanalysis
Hiroshi Sakamae

25. Electron-Stimulated Desorption
Naoya Miyauchi

26. Electron-Beam-Induced Current
Jun Chen, Takashi Sekiguchi

27. Ellipsometry
Toshihide Tsuru

28. Environmental SEM (Atmospheric SEM)
Yusuke Ominami

29. Environmental Transmission Electron Microscopy
Tadahiro Kawasaki

30. Extended X-Ray Absorption Fine Structure
Hitoshi Abe

31. Focused Ion Beam Scanning Electron Microscope
Tetsuo Sakamoto

32. Force Curve
Akinori Kogure

33. Force Spectroscopy
Christina Puckert, Michael J. Higgins

34. Frequency-Modulation Atomic Force Microscopy
Masayuki Abe

35. Gap-Mode Raman Spectroscopy
Katsuyoshi Ikeda

36. Glow Discharge Mass Spectrometry
Takashi Saka

37. Glow Discharge Optical Emission Spectrometry
Patrick Chapon, Sofia Gaiaschi, Kenichi Shimizu

38. Hard X-Ray Photoelectron Spectroscopy
Akira Sekiyama

39. Helium Atom Scattering
Takahiro Kondo

40. High-Resolution Elastic Recoil Detection Analysis
Kaoru Nakajima

41. High-Resolution Electron Energy Loss Spectroscopy
Hiroshi Okuyama

42. High-Resolution Rutherford Backscattering Spectrometry
Kaoru Nakajima

43. High-Speed Atomic Force Microscopy
Takayuki Uchihashi

44. Imaging Ellipsometry
Akiko N. Itakura

45. Impact Collision Ion Scattering Spectroscopy
Masakazu Aono, Mitsuhiro Katayama

46. Inelastic Electron Tunneling Spectroscopy
Akitoshi Shiotari

47. Infrared External-Reflection Spectroscopy
Takeshi Hasegawa

48. Infrared Reflection–Absorption Spectroscopy
Jun Yoshinobu

49. Interferometer Displacement Measurement
Masaya Toda

50. Inverse Photoemission Spectroscopy
Kaname Kanai

51. Kelvin Probe Force Microscope
Risa Fuji

52. Laser Ionization Secondary Neutral Mass Spectrometry
Tetsuo Sakamoto

53. Laser Photoelectron Spectroscopy
Ryuichi Arafune

54. Lateral Force Microscopy
Shiho Moriguchi

55. Liquid SPM/AFM
Akinori Kogure

56. Low-Energy Ion Scattering Spectroscopy
Kenji Umezawa

57. Low-Energy Electron Diffraction
Yoshimi Horio

58. Low-Energy Electron Microscope
H. Hibino

59. Magnetic Force Microscopy
Masato Hirade

60. Matrix-Assisted Laser Desorption/Ionization
Takaya Satoh

61. Medium-Energy Ion Scattering
Tomoaki Nishimura

62. Micro-Raman Spectroscopy
Katsumasa Fujita

63. Microprobe Reflection High-Energy Electron Diffraction
Masakazu Ichikawa

64. Multiple-Probe Scanning Probe Microscope
Tomonobu Nakayama

65. Nanoscale Angle-Resolved Photoelectron Spectroscopy
Koji Horiba

66. Nonlinear Spectroscopy
Shoichi Yamaguchi

67. Nuclear Reaction Analysis
Markus Wilde, Katsuyuki Fukutani

68. Optical Microscopy
Kazuya Kabayama, Ryugo Tero

69. Optical Second-Harmonic Generation Spectroscopy and Microscopy
Khuat Thi Thu Hien, Goro Mizutani

70. Particle-Induced X-Ray Emission
Koichiro Sera

71. Penning Ionization Electron Spectroscopy
Takuya Hosokai

72. Phase Mode SPM/AFM
Hideo Nakajima

73. Photoelectron Diffraction
Fumihiko Matsui, Tomohiro Matsushita

74. Photoelectron Holography
Tomohiro Matsushita, Fumihiko Matsui

75. Photoelectron Yield Spectroscopy
Hisao Ishii

76. Photoemission Electron Microscope
Toyohiko Kinoshita

77. Photoluminescence
Yuhei Miyauchi

78. Photon Emission from the Scanning Tunneling Microscope
Makoto Sakurai

79. Photo-Stimulated Desorption
Akihiko Ikeda, Katsuyuki Fukutani

80. Piezoresponse Force Microscope
Masato Hirade

81. Positron-Annihilation-Induced Desorption Spectroscopy
Takayuki Tachibana, Yasuyuki Nagashima

82. p-Polarized Multiple-angle Incidence Resolution Spectrometry
Takeshi Hasegawa

83. Quartz Crystal Microbalance
Yuji Teramura, Madoka Takai

84. Reflectance Difference Spectroscopy
Ken-ichi Shudo, Shin-ya Ohno

85. Reflection High-Energy Electron Diffraction
Yoshimi Horio

86. Resonant Inelastic X-Ray Scattering
Yoshihisa Harada

87. Rutherford Backscattering Spectrometry
Daiichiro Sekiba

88. Scanning Capacitance Microscopy
Nobuyuki Nakagiri

89. Scanning Electrochemical Microscopy
Yasufumi Takahashi

90. Scanning Electron Microscope Energy Dispersive X-Ray Spectrometry
Masaki Morita

91. Scanning Electron Microscopy
Yasuyuki Okano

92. Scanning Helium Ion Microscope
Keiko Onishi, Daisuke Fujita

93. Scanning Near-Field Optical Microscopy/Near-Field Scanning Optical Microscopy
Tetsuya Narushima

94. Scanning Probe Microscopy
Ken Nakajima

95. Scanning Transmission Electron Microscopy
Koji Kimoto

96. Scanning Transmission X-Ray Microscopy
Yasuo Takeichi

97. Scanning Tunneling Microscopy
Yukio Hasegawa

98. Scanning Tunneling Spectroscopy
Keisuke Sagisaka

99. Soft X-Ray Absorption Fine Structure
Kenta Amemiya

100. Spectroscopic Ellipsometry
Takumi Moriyama

101. Spin- and Angle-Resolved Photoelectron Spectroscopy
Taichi Okuda

102. Spin-Polarized Scanning Electron Microscopy
Teruo Kohashi

103. Spin-Polarized Scanning Tunneling Microscopy
Toyo Kazu Yamada

104. Spin-Resolved Photoemission Electron Microscopy
Keiki Fukumoto

105. Super-Resolution Microscopy
Kazuya Kabayama, Ryugo Tero

106. Surface Acoustic Wave
Shinya Sasaki

107. Surface Enhanced Raman Scattering
Katsuyoshi Ikeda

108. Surface Magneto-Optic Kerr Effect
Takeshi Nakagawa

109. Surface Plasmon Resonance
Kaoru Tamada

110. Surface Profilometer
Masahiro Tosa

111. Surface Sensitive Scanning Electron Microscopy
Yoshikazu Homma

112. Surface X-Ray Diffraction
Etsuo Arakawa

113. Surface-Enhanced Infrared Absorption Spectroscopy
Masatoshi Osawa

114. Synchrotron Radiation Photoelectron Spectroscopy
Jun Fujii

115. Synchrotron Scanning Tunneling Microscope
Toyoaki Eguchi

116. Thermal Desorption Spectroscopy
Shohei Ogura, Katsuyuki Fukutani

117. Time-of-Flight Secondary Ion Mass Spectrometry
Satoka Aoyagi

118. Time-Resolved Photoelectron Spectroscopy
Iwao Matsuda

119. Time-Resolved Photoemission Electron Microscopy
Atsushi Kubo

120. Time-Resolved Scanning Tunneling Microscopy
Hidemi Shigekawa

121. Tip-Enhanced Raman Scattering
Norihiko Hayazawa

122. Total Reflection X-Ray Fluorescence
Jun Kawai

123. Transmission Electron Diffraction
Yoshio Matsui

124. Transmission Electron Microscope
Masanori Mitome

125. Ultraviolet Photoelectron Spectroscopy
Kenichi Ozawa

126. Ultraviolet–Visible Spectrophotometry
Hiro Amekura

127. Vibrational Sum Frequency Generation Spectroscopy
Satoshi Nihonyanagi, Tahei Tahara

128. X-Ray Absorption Near Edge Structure
Hitoshi Abe

129. X-Ray-Aided Noncontact Atomic Force Microscopy
Shushi Suzuki, Wang-Jae Chun, Masaharu Nomura, Kiyotaka Asakura

130. X-Ray Crystal Truncation Rod Scattering
Tetsuroh Shirasawa

131. X-Ray Magnetic Circular Dichroism
Kenta Amemiya

132. X-Ray Photoelectron Spectroscopy
Makoto Nakamura

133. X-Ray Reflectivity
Wolfgang Voegeli

134. X-Ray Standing Wave Method
Akira Saito

Keywords: Materials Science, Characterization and Evaluation of Materials, Spectroscopy/Spectrometry, Spectroscopy and Microscopy, Surface and Interface Science, Thin Films, Surfaces and Interfaces, Thin Films

Editor
Publisher
Springer
Publication year
2018
Language
en
Edition
1
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (PDF)
9789811061561
Printed ISBN
978-981-10-6155-4

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