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Jen, Tsung-Hau

Educational Measurement for Applied Researchers

Jen, Tsung-Hau - Educational Measurement for Applied Researchers, ebook

138,35€

Ebook, PDF with Adobe DRM
ISBN: 9789811033025
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Table of contents

1. What Is Measurement?
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen

2. Construct, Framework and Test Development—From IRT Perspectives
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen

3. Test Design
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen

4. Test Administration and Data Preparation
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen

5. Classical Test Theory
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen

6. An Ideal Measurement
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen

7. Rasch Model (The Dichotomous Case)
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen

8. Residual-Based Fit Statistics
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen

9. Partial Credit Model
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen

10. Two-Parameter IRT Models
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen

11. Differential Item Function
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen

12. Equating
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen

13. Facets Models
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen

14. Bayesian IRT Models (MML Estimation)
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen

15. Multidimensional IRT Models
Margaret Wu, Hak Ping Tam, Tsung-Hau Jen

Keywords: Statistics, Statistical Theory and Methods, Statistics for Social Science, Behavorial Science, Education, Public Policy, and Law, Assessment, Testing and Evaluation, Mathematics in the Humanities and Social Sciences, Mathematical Software

Author(s)
 
 
Publisher
Springer
Publication year
2016
Language
en
Edition
1
Category
Natural Sciences
Format
Ebook
eISBN (PDF)
9789811033025
Printed ISBN
978-981-10-3300-1

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