Chattopadhyay, Anupam
High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
Table of contents
1. Introduction
Zheng Wang, Anupam Chattopadhyay
2. Background
Zheng Wang, Anupam Chattopadhyay
3. State-of-the-Art
Zheng Wang, Anupam Chattopadhyay
4. High-Level Fault Injection and Simulation
Zheng Wang, Anupam Chattopadhyay
5. Architectural Reliability Estimation
Zheng Wang, Anupam Chattopadhyay
6. Architectural Reliability Exploration
Zheng Wang, Anupam Chattopadhyay
7. System-Level Reliability Exploration
Zheng Wang, Anupam Chattopadhyay
8. Conclusion and Outlook
Zheng Wang, Anupam Chattopadhyay
Keywords: Engineering, Circuits and Systems, Performance and Reliability, Electronic Circuits and Devices
- Author(s)
- Chattopadhyay, Anupam
- Wang, Zheng
- Publisher
- Springer
- Publication year
- 2018
- Language
- en
- Edition
- 1
- Series
- Computer Architecture and Design Methodologies
- Page amount
- 20 pages
- Category
- Technology, Energy, Traffic
- Format
- Ebook
- eISBN (PDF)
- 9789811010736
- Printed ISBN
- 978-981-10-1072-9
