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Franco, Jacopo

Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

Franco, Jacopo - Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications, ebook

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ISBN: 9789400776630
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Table of contents

1. Introduction
Jacopo Franco, Ben Kaczer, Guido Groeseneken

2. Degradation Mechanisms
Jacopo Franco, Ben Kaczer, Guido Groeseneken

3. Techniques and Devices
Jacopo Franco, Ben Kaczer, Guido Groeseneken

4. Negative Bias Temperature Instability in (Si)Ge pMOSFETs
Jacopo Franco, Ben Kaczer, Guido Groeseneken

5. Negative Bias Temperature Instability in Nanoscale Devices
Jacopo Franco, Ben Kaczer, Guido Groeseneken

6. Channel Hot Carriers and Other Reliability Mechanisms
Jacopo Franco, Ben Kaczer, Guido Groeseneken

7. Conclusions and Perspectives
Jacopo Franco, Ben Kaczer, Guido Groeseneken

Keywords: Physics, Semiconductors, Circuits and Systems, Optical and Electronic Materials, Electronic Circuits and Devices

Author(s)
 
 
Publisher
Springer
Publication year
2014
Language
en
Edition
2014
Series
Springer Series in Advanced Microelectronics
Category
Natural Sciences
Format
Ebook
eISBN (PDF)
9789400776630

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