Test Pattern Generation using Boolean Proof Engines

1. Introduction

2. Preliminaries

3. Boolean Satisfiability

4. SAT-Based ATPG

5. Learning Techniques

6. Multiple-Valued Logic

7. Improved Circuit-to-CNF Conversion

8. Branching Strategies

9. Integration into Industrial Flow

10. Delay Faults

11. Summary and Outlook

Keywords: Engineering, Circuits and Systems, Electronics and Microelectronics, Instrumentation