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Bracco, Gianangelo

Surface Science Techniques

Bracco, Gianangelo - Surface Science Techniques, ebook

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ISBN: 9783642342431
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Table of contents

1. Contact Angle and Wetting Properties
Yuehua Yuan, T. Randall Lee

2. Adsorption Calorimetry on Well-Defined Surfaces
Ole Lytken, Hans-Jörg Drescher, Rickmer Kose, J. Michael Gottfried

3. Methods of IR Spectroscopy for Surfaces and Thin Films
David Allara, Josh Stapleton

4. A Surface Scientist’s View on Spectroscopic Ellipsometry
Maurizio Canepa

5. Nonlinear Vibrational Spectroscopy
Lee J. Richter

6. Grazing Incidence X-Ray Diffraction
Osami Sakata, Masashi Nakamura

7. X-Ray Reflectivity
A. Gibaud, M. S. Chebil, T. Beuvier

8. Resonant Photoelectron Diffraction
Alberto Verdini, Peter Krüger, Luca Floreano

9. Surface Structure Analysis with X-Ray Standing Waves
Jörg Zegenhagen

10. Advanced Applications of NEXAFS Spectroscopy for Functionalized Surfaces
Alexei Nefedov, Christof Wöll

11. Neutron Reflectivity
Frédéric Ott

12. Probing Surfaces with Thermal He Atoms: Scattering and Microscopy with a Soft Touch
Bodil Holst, Gianangelo Bracco

13. The Helium Spin-Echo Method
Andrew Jardine

14. Diffraction of H2 from Metal Surfaces
Daniel Farías, Marina Minniti, Rodolfo Miranda

15. Low Energy Ion Scattering and Recoiling Spectroscopy in Surface Science
Vladimir A. Esaulov

16. Helium Ion Microscopy
Diederik J. Maas, Raoul Gastel

17. High Resolution Electron Energy Loss Spectroscopy (HREELS): A Sensitive and Versatile Surface Tool
Luca Vattuone, Letizia Savio, Mario Rocca

18. Low-Energy Electron Microscopy
Juan Figuera, Kevin F. McCarty

19. Scanning Tunneling Microscopy
Ada Della Pia, Giovanni Costantini

20. Surface Characterization Using Atomic Force Microscopy (AFM) in Liquid Environments
Venetia D. Lyles, Wilson K. Serem, Jing-Jiang Yu, Jayne C. Garno

21. Atomic Force Microscopy for Surface Imaging and Characterization of Supported Nanostructures
Franciszek Krok, Bartosz Such, Jacek J. Kolodziej, Marek Szymonski

Keywords: Physics, Surface and Interface Science, Thin Films, Measurement Science and Instrumentation, Nanotechnology, Optics, Optoelectronics, Plasmonics and Optical Devices, Particle Acceleration and Detection, Beam Physics, Nanoscale Science and Technology

Author(s)
 
Publisher
Springer
Publication year
2013
Language
en
Edition
2013
Series
Springer Series in Surface Sciences
Page amount
23 pages
Category
Natural Sciences
Format
Ebook
eISBN (PDF)
9783642342431

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