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Hofmann, Siegfried

Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

Hofmann, Siegfried - Auger- and X-Ray Photoelectron Spectroscopy in Materials Science, ebook

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ISBN: 9783642273810
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Table of contents

1. Introduction and Outline
Siegfried Hofmann

2. Instrumentation
Siegfried Hofmann

3. Qualitative Analysis (Principle and Spectral Interpretation)
Siegfried Hofmann

4. Quantitative Analysis (Data Evaluation)
Siegfried Hofmann

5. Optimizing Measured Signal Intensity: Emission Angle, Incidence Angle and Surface Roughness
Siegfried Hofmann

6. Optimizing Certainty and the Detection Limit: Signal-to-Noise Ratio
Siegfried Hofmann

7. Quantitative Compositional Depth Profiling
Siegfried Hofmann

8. Practice of Surface and Interface Analysis with AES and XPS
Siegfried Hofmann

9. Typical Applications of AES and XPS
Siegfried Hofmann

10. Surface Analysis Techniques Related to AES and XPS
Siegfried Hofmann

Keywords: Physics, Solid State Physics, Spectroscopy and Microscopy, Surfaces and Interfaces, Thin Films

Author(s)
Publisher
Springer
Publication year
2013
Language
en
Edition
2013
Series
Springer Series in Surface Sciences
Page amount
19 pages
Category
Natural Sciences
Format
Ebook
eISBN (PDF)
9783642273810

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