Sadewasser, Sascha
Kelvin Probe Force Microscopy
1. Introduction
S. Sadewasser, Th. Glatzel
2. Experimental Technique and Working Modes
S. Sadewasser
3. Capacitive Crosstalk in AM-Mode KPFM
H. Diesinger, D. Deresmes, T. Mélin
4. The Effect of the Measuring Tip and Image Reconstruction
Y. Rosenwaks, G. Elias, E. Strassbourg, A. Schwarzman, A. Boag
5. Contribution of the Numerical Approach to Kelvin Probe Force Microscopy on the Atomic-Scale
Laurent Nony, Franck Bocquet, Adam S. Foster, Christian Loppacher
6. Electronic Surface Properties of Semiconductor Surfaces and Interfaces
R. Shikler
7. Surface Properties of Nanostructures Supported on Semiconductor Substrates
F. Krok, J. Konior, M. Szymonski
8. Optoelectronic Studies of Solar Cells
S. Sadewasser
9. Electrostatic Force Microscopy Characterization of Low Dimensional Systems
Yoichi Miyahara, Lynda Cockins, Peter Grütter
10. Local Work Function of Catalysts and Photoelectrodes
H. Onishi, A. Sasahara
11. Electronic Properties of Metal/Organic Interfaces
Christian Loppacher
12. KPFM and PFM of Biological Systems
B. J. Rodriguez, S. V. Kalinin
13. Measuring Atomic-Scale Variations of the Electrostatic Force
Th. Glatzel
Keywords: Materials Science, Surfaces and Interfaces, Thin Films, Thermodynamics, Engineering Thermodynamics, Heat and Mass Transfer
- Author(s)
- Sadewasser, Sascha
- Glatzel, Thilo
- Publisher
- Springer
- Publication year
- 2012
- Language
- en
- Edition
- 1
- Series
- Springer Series in Surface Sciences
- Page amount
- 14 pages
- Category
- Technology, Energy, Traffic
- Format
- Ebook
- eISBN (PDF)
- 9783642225666