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Sadewasser, Sascha

Kelvin Probe Force Microscopy

Sadewasser, Sascha - Kelvin Probe Force Microscopy, ebook

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ISBN: 9783642225666
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Table of contents

1. Introduction
S. Sadewasser, Th. Glatzel

2. Experimental Technique and Working Modes
S. Sadewasser

3. Capacitive Crosstalk in AM-Mode KPFM
H. Diesinger, D. Deresmes, T. Mélin

4. The Effect of the Measuring Tip and Image Reconstruction
Y. Rosenwaks, G. Elias, E. Strassbourg, A. Schwarzman, A. Boag

5. Contribution of the Numerical Approach to Kelvin Probe Force Microscopy on the Atomic-Scale
Laurent Nony, Franck Bocquet, Adam S. Foster, Christian Loppacher

6. Electronic Surface Properties of Semiconductor Surfaces and Interfaces
R. Shikler

7. Surface Properties of Nanostructures Supported on Semiconductor Substrates
F. Krok, J. Konior, M. Szymonski

8. Optoelectronic Studies of Solar Cells
S. Sadewasser

9. Electrostatic Force Microscopy Characterization of Low Dimensional Systems
Yoichi Miyahara, Lynda Cockins, Peter Grütter

10. Local Work Function of Catalysts and Photoelectrodes
H. Onishi, A. Sasahara

11. Electronic Properties of Metal/Organic Interfaces
Christian Loppacher

12. KPFM and PFM of Biological Systems
B. J. Rodriguez, S. V. Kalinin

13. Measuring Atomic-Scale Variations of the Electrostatic Force
Th. Glatzel

Keywords: Materials Science, Surfaces and Interfaces, Thin Films, Thermodynamics, Engineering Thermodynamics, Heat and Mass Transfer

Author(s)
 
Publisher
Springer
Publication year
2012
Language
en
Edition
1
Series
Springer Series in Surface Sciences
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (PDF)
9783642225666

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