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Bhushan, Bharat

Applied Scanning Probe Methods XI

Bhushan, Bharat - Applied Scanning Probe Methods XI, ebook

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ISBN: 9783540850373
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Table of contents

1. Oscillation Control in Dynamic SPM with Quartz Sensors
Johann Jersch, Harald Fuchs

2. Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation
Elmar Bonaccurso, Dmytro S. Golovko, Paolo Bonanno, Roberto Raiteri, Thomas Haschke, Wolfgang Wiechert, Hans-Jürgen Butt

3. Mechanical Diode-Based Ultrasonic Atomic Force Microscopies
M. Teresa Cuberes

4. Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science
Maurice Brogly, Houssein Awada, Olivier Noel

5. Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements
Donna C. Hurley

6. AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip
Lorenzo Calabri, Nicola Pugno, Sergio Valeri

7. Local Mechanical Properties by Atomic Force Microscopy Nanoindentations
Davide Tranchida, Stefano Piccarolo

8. Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction
Mykhaylo Evstigneev

Keywords: Chemistry, Nanotechnology, Surfaces and Interfaces, Thin Films, Polymer Sciences, Physical Chemistry, Solid State Physics and Spectroscopy

Author(s)
 
Publisher
Springer
Publication year
2009
Language
en
Edition
1
Series
NanoScience and Technology
Page amount
291 pages
Category
Natural Sciences
Format
Ebook
eISBN (PDF)
9783540850373

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