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Osten, Wolfgang

Fringe 2005

Osten, Wolfgang - Fringe 2005, ebook

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ISBN: 9783540293033
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Table of contents

1. Optical Measurement Techniques
R.S. Sirohi

Session 1.New Methods and Tools for Data Processing

2. New Challenges for Optical Metrology: Evolution or Revolution
Malgorzata Kujawinska

3. Interpreting interferometric height measurements using the instrument transfer function
Peter Groot, Xavier Colonna Lega

4. Are Residues of Primary Importance in Phase Unwrapping?
Karl A. Stetson

5. Experimental Study of Coherence Vortices: Birth and Evolution of Phase Singularities in the Spatial Coherence Function
Wei Wang, Zhihui Duan, Steen G. Hanson, Yoko Miyamoto, Mitsuo Takeda

6. Properties of Isothetic Lines in Discontinuous Fields
C.A. Sciammarella, F.M. Sciammarella

7. Heterodyne, quasi-heterodyne and after
René Dändliker

8. Robust three-dimensional phase unwrapping algorithm for phase contrast magnetic resonance velocity imaging
Jonathan M. Huntley, María F. Salfity, Pablo D. Ruiz, Martin J. Graves, Rhodri Cusack, Daniel A. Beauregard

9. Signal processing of interferogram using a two-dimensional discrete Hilbert transform
Ribun Onodera, Yoshitaka Yamamoto, Yukihiro Ishii

10. Recent advances in automatic demodulation of single fringe patterns
J. A. Quiroga, D. Crespo, J. A. Gomez Pedrero, J. C. Martinez-Antón

11. Comparison of Techniques for Fringe Pattern Background Evaluation
C. Breluzeau, A. Bosseboeuf, S. Petitgrand

12. Deformed surfaces in holographic Interferometry. Similar aspects concerning nonspherical gravitational fields
Walter Schumann

13. Dynamic evaluation of fringe parameters by recurrence processing algorithms
Igor Gurov, Alexey Zakharov

14. Fast hologram computation for holographic tweezers
Tobias Haist, Marcus Reicherter, Avinash Burla, Lars Seifert, Mark Hollis, Wolfgang Osten

15. Wavelet analysis of speckle patterns with a temporal carrier
Yu Fu, Chenggen Quan, Cho Jui Tay, Hong Miao

16. Different preprocessing and wavelet transform based filtering techniques to improve Signal- to-noise ratio in DSPI fringes
Chandra Shakher, Saba Mirza, Vijay Raj Singh, Md. Mosarraf Hossain, Rajpal S Sirohi

17. Wavefront Optimization using Piston Micro Mirror Arrays
Jan Liesener, Wolfgang Osten

18. Adaptive Correction to the Speckle Correlation Fringes using twisted nematic LCD
Erwin Hack, Phanindra Narayan Gundu

19. Random phase shift interferometer
Radu Doloca, Rainer Tutsch

20. Spatial correlation function of the laser speckle field with holographic technique
Vladimir Markov, Anatoliy Khizhnyak

21. Fault detection from temporal unusualness in fringe patterns
Qian Kemao, Seah Hock Soon, Anand Asundi

22. The Virtual Fringe Projection System (VFPS) and Neural Networks
Thomas Böttner, Markus Kästner

23. Fringe contrast enhancement using an interpolation technique
F.J. Cuevas, F. Mendoza Santoyo, G. Garnica, J. Rayas, J.H. Sossa

24. Some remarks on accuracy of imaging polarimetry with carrier frequency
Slawomir Drobczynski, Henryk Kasprzak

25. Application of weighted smoothing splines to the local denoising of digital speckle pattern interferometry fringes
Alejandro Federico, Guillermo H. Kaufmann

26. Investigation of the fringe order in multi-component shearography surface strain measurement
Roger M. Groves, Stephen W. James, Ralph P. Tatam

27. Metrological Fringe inpainting
Qian Kemao, Seah Hock Soon, Anand Asundi

28. Combination of Digital Image Correlation Techniques and Spatial Phase Shifting Interferometry for 3D-Displacement Detection and Noise Reduction of Phase Difference Data
Björn Kemper, Patrik Langehanenberg, Sabine Knoche, Gert Bally

29. Photoelastic tomography for birefringence determination in optical microelements
Tomasz Kozacki, Pawel Kniazewski, Malgorzata Kujawinska

30. Optimization of electronic speckle pattern interferometers
Amalia Martínez, Juan Antonio Rayas, Raúl Corsero

31. Properties of phase shifting methods applied to time average interferometry of vibrating objects
K. Patorski, A. Styk

32. Depth-resolved displacement measurement using Tilt Scanning Speckle Interferometry
Pablo D. Ruiz, Jonathan M. Huntley

33. New Phase Unwrapping Strategy for Rapid and Dense 3D Data Acquisition in Structured Light Approach
G Sai Siva, L Kameswara Rao

34. Determination of modulation and background intensity by uncalibrated temporal phase stepping in a two-bucket spatially phase stepped speckle interferometer
Peter A.A.M. Somers, Nandini Bhattacharya

Session 2.Resolution Enhanced Technologies

35. EUVA’s challenges toward 0.1nm accuracy in EUV at-wavelength interferometry
Katsumi Sugisaki, Masanobu Hasegawa, Masashi Okada, Zhu Yucong, Katsura Otaki, Zhiqiang Liu, Mikihiko Ishii, Jun Kawakami, Katsuhiko Murakami, Jun Saito, Seima Kato, Chidane Ouchi, Akinori Ohkubo, Yoshiyuki Sekine, Takayuki Hasegawa, Akiyoshi Suzuki, Masahito Niibe, Mitsuo Takeda

36. Some similarities and dissimilarities of imaging simulation for optical microscopy and lithography
Michael Totzeck

37. A Ronchi-Shearing Interferometer for compaction test at a wavelength of 193nm
Irina Harder, Johannes Schwider, Norbert Lindlein

38. Simulation and error budget for high precision interferometry
Johannes Zellner, Bernd Dörband, Heiko Feldmann

39. Progress on the wide scale Nano-positioning and Nanomeasuring Machine by Integration of Optical-Nanoprobes
Gerd Jäger, Tino Hausotte, Eberhard Manske, Hans-Joachim Büchner, Rostyslav Mastylo, Natalja Dorozhovets, Roland Füßl, Rainer Grünwald

40. Through-Focus Point-Spread Function Evaluation for Lens Metrology using the Extended Nijboer-Zernike Theory
Joseph J.M. Braat, Peter Dirksen, Augustus J.E.M. Janssen

41. Digital Holographic Microscopy (DHM) applied to Optical Metrology: A resolution enhanced imaging technology applied to inspection of microscopic devices with subwavelength resolution
Christian D. Depeursinge, Anca M. Marian, Frederic Montfort, Tristan Colomb, Florian Charrière, Jonas Kühn, Etienne Cuche, Yves Emery, Pierre Marquet

42. An adaptive holographic interferometer for high precision measurements
Theo Tschudi, Viktor M. Petrov, Jürgen Petter, Sören Lichtenberg, Christian Heinisch, Julia Hahn

43. Spatio-Temporal Joint Transform Correlator and Fourier Domain OCT
T. Yatagai, Y. Yasuno, M. Itoh

44. Subdivision of Nonlinearity in Heterodyne Interferometers
Wenmei Hou

Session 3.Wide Scale 4D Optical Metrology

45. Progress in SAR Interferometry
Otmar Loffeld

46. New calibration procedure for measuring shape on specular surfaces
Petra Aswendt, Sören Gärtner, Roland Höfling

47. Fringe Reflection for high resolution topometry and surface description on variable lateral scales
Thorsten Bothe, Wansong Li, Christoph Kopylow, Werner Jüptner

48. Full-Field Shape Measurement of Specular Surfaces
Jürgen Kaminski, Svenja Lowitzsch, Markus C. Knauer, Gerd Häusler

49. Numerical Integration of Sampled Data for Shape Measurements: Metrological Specification
L. P. Yaroslavsky, A. Moreno, J. Campos

50. Fringe analysis in scanning frequency interferometry for absolute distance measurement
Pierre Pfeiffer, Luc Perret, Rabah Mokdad, Bertrand Pecheux

51. Surface Shape Measurement by Dual-wavelength Phase-shifting Digital Holography
Ichirou Yamaguchi, Shinji Yamashita, Masayuki Yokota

52. Phase-shifting interferometric profilometry with a wide tunable laser source
Yukihiro Ishii1, Ribun Onodera, Takeshi Takahashi

53. Opto-Mechatronic System for Sub-Micro Shape Inspection of Innovative Optical Components for Example of Head-Up-Displays
Peter Andrä, Hans Schamberger, Johann Zänkert

54. 3-D profilometry with acousto-optic fringe interferometry
Xiang Peng, Jindong Tian

55. Phase-shifting shearing interferometry with a variable polarization grating recorded on Bacteriorhodopsin
Eugenio Garbusi, Erna M. Frins, José A. Ferrari

56. Quasi-absolute testing of aspherics using Combined Diffractive Optical Elements
Gufran Khan, Klaus Mantel, Norbert Lindlein, Johannes Schwider

57. Selfcalibrating fringe projection setups for industrial use
Gunther Notni, Peter Kühmstedt, Matthias Heinze, Christoph Munkelt, Michael Himmelreich

58. 3-D shape measurement method using point-array encoding
Jindong Tian, Xiang Peng

59. 3D measurement of human face by stereophotogrammetry
Holger Wagner, Axel Wiegmann, Richard Kowarschik, Friedrich Zöllner

60. Fast 3D shape measurement system based on colour structure light projection
Marek Wegiel, Malgorzata Kujawinska

Session 4.Hybrid Measurement Technologies

61. Tip Geometry and Tip-Sample Interactions in Scanning Probe Microscopy (SPM)
Ludger Koenders, Andrew Yacoot

62. Applications of time-averaged digital holographic interferometry
Nazif Demoli, Kristina Šariri, Dalibor Vukicevic, Marc Torzynski

63. Spatio-temporal encoding using digital Fresnel holography
Pascal Picart, Michel Grill, Julien Leval, Jean Pierre Boileau, Francis Piquet

64. High resolution optical reconstruction of digital holograms
Günther Wernicke, Matthias Dürr, Hartmut Gruber, Andreas Hermerschmidt, Sven Krüger, Andreas Langner

65. Application of Interferometry and Electronic Speckle Pattern Interferometry (ESPI) for Measurements on MEMS
J. Engelsberger, E-H. Nösekabel, M. Steinbichler

66. Full-field, real-time, optical metrology for structural integrity diagnostics
Jim Trolinger, Vladimir Markov, Jim Kilpatrick

67. 3D Micro Technology: Challenges for Optical Metrology
Theodore Doll, Peter Detemple, Stefan Kunz, Thomas Klotzbücher

68. Interferometric Technique for Characterization of Ferroelectric Crystals Properties and Microengineering Process
Simonetta Grilli, Pietro Ferraro, Domenico Alfieri, Melania Paturzo, Lucia Sansone, Sergio Nicola, Paolo Natale

69. Holographic interferometry as a tool to capture impact induced shock waves in carbon fibre composites
J. Müller, J. Geldmacher, C. König, M. Calomfirescu, W. Jüptner

70. Two new techniques to improve interferometric deformation-measurement: Lockin and Ultrasound excited Speckle-Interferometry
Henry Gerhard, Gerhard Busse

71. Testing formed sheet metal parts using fringe projection and evaluation by virtual distortion compensation
A. Weckenmann, A. Gabbia

72. Fatigue damage precursor detection and monitoring with laser scanning technique
V B Markov, B D Buckner, S A Kupiec, J C Earthman

73. Analysis of localization of strains by ESPI, in equibiaxial loading (bulge test) of copper sheet metals
Guillaume Montay, Ignacio Lira, Marie Tourneix, Bruno Guelorget, Manuel François, Cristián Vial

74. Laser vibrometry using digital Fresnel holography
Pascal Picart, Julien Leval, Jean Pierre Boileau, Jean Claude Pascal

75. 2D laser vibrometry by use of digital holographic spatial multiplexing
Pascal Picart, Julien Leval, Michel Grill, Jean Pierre Boileau, Jean Claude Pascal

76. Fatigue Detection of Fibres Reinforced Composite Materials by Fringes Projection and Speckle Shear Interferometry
Ventseslav Sainov, Jana Harizanova, Sonja Ossikovska, Wim Paepegem, Joris Degrieck, Pierre Boone

77. Multifunctional interferometric platform specialised for active components of MEMS/MOEMS characterisation
Leszek Salbut, Michal Jozwik

78. Laser Multitask ND Technology in Conservation Diagnostic Procedures
V. Tornari, E. Tsiranidou, Y. Orphanos, C. Falldorf, R. Klattenhof, E. Esposito, A. Agnani, R. Dabu, A. Stratan, A. Anastassopoulos, D. Schipper, J. Hasperhoven, M. Stefanaggi, H. Bonnici, D. Ursu

Session 5.New Optical Sensors and Measurement Systems

79. Progress in Scanning Holographic Microscopy for Biomedical Applications
Ting-Chung Poon

80. The Dynamics of Life: Imaging Temperature and Refractive Index Variations Surrounding Material and Biological Systems with Dynamic Interferometry
Katherine Creath, Gary E. Schwartz

81. Microsystem based optical measurement systems: case of opto-mechanical sensors
Michal Józwik, Christophe Gorecki, Andrei Sabac, Thierry Dean, Alain Jacobelli

82. White-light interferometry with higher accuracy and more speed
Claus Richter, Bernhard Wiesnerand, Reinhard Groß, Gerd Häusler

83. Novel white light Interferometer with miniaturised Sensor Tip
Frank Depiereux, Robert Schmitt, Tilo Pfeifer

84. Challenges in the dimensional Calibration of submicrometer Structures by Help of optical Microscopy
Werner Mirandé

85. A white light interferometer for measurement of external cylindrical surfaces
Armando Albertazzi G., Alex Dal Pont

86. Pixelated Phase-Mask Dynamic Interferometers
James Millerd, Neal Brock, John Hayes, Michael North-Morris, Brad Kimbrough, James Wyant

87. Tomographic mapping of airborne sound fields by TV-holography
K. D. Hinsch, H. Joost, G. Gülker

88. Dynamic ESPI system for spatio-temporal strain analysis
Satoru Toyooka, Hirofumi Kadono, Takayuki Saitou, Ping Sun, Tomohisa Shiraishi, Manabu Tominaga

89. Digital holographic microscope for dynamic characterization of a micromechanical shunt switch
Valerio Striano, Giuseppe Coppola, Pietro Ferraro, Domenico Alfieri, Sergio Nicola, Andrea Finizio, Giovanni Pierattini, Romolo Marcelli

90. Digital Holographic Microscopy (DHM): Fast and Robust 3D measurements with interferometric resolution for industrial inspection
Yves Emery, Etienne Cuche, François Marquet, Sébastien Bourquin, Pierre Marquet, Jonas Kühn, Nicolas Aspert, Mikhail Botkin, Christian Depeursinge

91. Digital Micromirror Arrays (DMD) — a proven MEMS technology looking for new emerging applications in optical metrology
Roland Höfling, Cheraina Dunn

92. Optimised projection lens for the use in digital fringe projection
Christian Bräuer-Burchardt, Martin Palme, Peter Kühmstedt, Gunther Notni

93. Absolute Calibration of Cylindrical Specimens in Grazing Incidence Interferometry
Klaus Mantel, Jürgen Lamprecht, Norbert Lindlein, Johannes Schwider

94. Digital holographic interferometer with active wavefront control by means of liquid crystal on silicon spatial light modulator
Aneta Michalkiewicz, Jerzy Krezel, Malgorzata Kujawinska, Xingua Wang, Philips J. Bos

95. In-Situ-Detection of Cooling Lubricant Residues on Metal Surfaces Using a Miniaturised NIR-LEDPhotodiode-System
Kai-Udo Modrich

96. Chromatic Confocal Spectral Interferometry — (CCSI)
Evangelos Papastathopoulos, Klaus Körner, Wolfgang Osten

97. A simple and efficient optical 3D-Sensor based on “Photometric Stereo” (“UV-Laser Therapy”)
F. Wolfsgruber, C. Rühl, J. Kaminski, L. Kraus, G. Häusler, R. Lampalzer, E.-B. Häußler, P. Kaudewitz, F. Klämpfl, A. Görtler

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Keywords: TECHNOLOGY & ENGINEERING / General TEC000000

Author(s)
Publisher
Springer
Publication year
2006
Language
en
Edition
1
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (PDF)
9783540293033

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