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Lanza, Mario

Conductive Atomic Force Microscope

Lanza, Mario - Conductive Atomic Force Microscope, ebook

156,25€

Ebook, ePUB with Adobe DRM
ISBN: 9783527699797
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Printing115 pages with an additional page accrued every 7 hours, capped at 115 pages
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The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale.
To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM.
With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.

Keywords: Nanomaterials, Electronic Materials, Nanomaterials, Electronic Materials

Author(s)
Publisher
John Wiley and Sons, Inc.
Publication year
2017
Language
en
Edition
1
Page amount
384 pages
Category
Natural Sciences
Format
Ebook
eISBN (ePUB)
9783527699797
Printed ISBN
9783527340910

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